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Leica´s first dual core 3D measuring microscope to combine confocal and interferometry technology DCM 3D. This system has been designed for fast, non-invasive assessment of micro and nano structures of technical surfaces, in multiple configurations. It combines confocal and interferometry technology for high speed and high-resolution measurements down to 0.1nm. And, the micro display confocal technology, with no moving parts, measures a variety of materials and provides confocal and bright field images simultaneously.
- Confocal and Interferometry
- Dual core technology for high speed measurements and high resolution from 0.1 nm to 10 mm.
- Micro display confocal technology
- Confocal and bright field imaging of the same area simultaneously.
- Interferometry PSI and VSI
- Provides the highest precision measurement of smooth surfaces with sub-nanometer resolution.
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