Leica EM RES102
Thin, clean, polish, cut slopes, and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM, and LM samples in one benchtop unit.
A variety of sample holders allows a diverse range of applications to be carried out. Besides high-energy ion beam milling, it can also use the Leica EM RES102 for very gentle sample processing using low ion energy.
Effective and Cost-efficient
- One system for TEM, SEM, and LM applications
- SEM preparation of samples up to 25 mm diameter
- Improved effectiveness in TEM sample preparation with the production of large electron transparent areas for TEM analysis
- LAN capability for remote control and monitoring
Safe
Fully program-controlled motorized ion source and sample movements for reproducible results
Native specimens
LN2 sample stage cooling to maintain the integrity of temperature-sensitive samples
Easy operation
- Integrated applications library
- Integrated help files and tutorial videos for beginners and maintenance
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