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EDAX Element EDS

EDS SOftware

The APEX™ software is an idealized program developed for first-time users with analysis functions for Point and Area Qualitative or Quantitative Elemental Analysis, Mapping, Line Scan, and built-in Reporting. APEX™ is designed with a “project” methodology.

  1. High speed embedded type SDD Dectector (No LN2 required)
  2. Energy resolution: Less than 133 eV (at Mn Ka)
  3. Detector area: 30mm
  4. Window: Silicon Nitride (Si3N4)
  5. Element detection range: Be(4) – Am(95)
  6. Maximum input count rate: > 300 kcps
  7. Software: Qualitative or Quantitative  Analysis
  8. Analysis Modes:  Point, Circle, Polygon, Line Scan, Mapping
  9. Touch Screen Mode

Intuitive and Adjustable User Interface

  • Operators can start based on inspection settings as they have saved and it can accomplish analysis processes with minimal effort
  • “Only 3 clicks” are needed to collect a Spectrum of Qualitative, Quantitative analysis, and saving
  • Multiple screen layouts are easily set with a single mouse click
  • Background colors can be set for either a light or dark preference
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Qualitative / Quantitative analysis

  • Able to know the element and amount to about unknown sample in a short time (within 1 min)
  • Get information about the area to see fast and easily by various scanning methods (point, area…).
  • Reliable element analysis and 3 types of comparison charts or tables listing elements by Weight (wt%), Atomic (at%), Error (%)
  • ZAF corrections and analysis result in tables

Multi-Point analysis

  • Mark several locations to inspect in the sample by point, area, or other scanning methods
  • Analyze and save automatically
  • Enhance the reliability of analysis results by realizing 4 analysis conditions of the selected area
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High-Speed Mapping

  • Analyze the distribution of elements easily in samples with different color coding
  • Get desired information in real-time at low resolution or at higher resolution with short analysis times
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Line Scan

  • Another way to check the elements distribution of the sample. Analyze with the line set by the user and assert the distribution of each element clearly.
  • Create SEM Image Line-scan overlap & Element Profile

Reporting

  • After acquiring results, it can generate reports per user requirements showing any of the gained data in various formats
  • Ability to change or edit by saving an original files in MS Word, Excel, PowerPoint formats, or PDF

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