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SUMMARY:Webinar: Cone Beam CT vs. Oblique CT
DESCRIPTION:📅 Date: May 14\n🎤 Speaker: Yifan Jiang\n💬 Live Q&A: Yifan Jiang and Tim Schoen \nIn this session\, Yifan will walk through real-world examples of how X-ray CT helps reveal hidden issues such as solder voids\, cracks\, delamination\, and internal structural defects in electronic devices. Attendees will gain practical insights into how CT imaging can improve failure diagnostics\, quality control\, and product development. \nTim will also join the session to assist with the live Q&A\, helping answer audience questions about CT workflows\, applications\, and best practices. \nWhat You’ll Learn\n\nHow X-ray CT works for non-destructive electronic inspection\nCommon electronic failure modes detected with CT\nHow CT reveals internal defects invisible to traditional inspection methods\nPractical examples of CT imaging in electronic failure analysis\nWhen CT should be used alongside other analytical techniques\n\nThis webinar is ideal for engineers\, failure analysis specialists\, quality engineers\, and researchers working with electronic devices and assemblies. \nStay until the end for a live Q&A session where you can ask questions and discuss your specific applications with our experts. \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/webinar-x-ray-ct-applications-for-electronic-failure-analysis/
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