BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//JH Technologies - ECPv6.18.1//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:JH Technologies
X-ORIGINAL-URL:https://www.jhtechnologies.com
X-WR-CALDESC:Events for JH Technologies
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/Los_Angeles
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20250309T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20251102T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20260308T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20261101T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20270314T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20271107T090000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260703T173000
DTEND;TZID=America/Los_Angeles:20260703T183000
DTSTAMP:20260710T185700Z
CREATED:20260710T185700Z
LAST-MODIFIED:20260710T185700Z
UID:15041-1783099800-1783103400@www.jhtechnologies.com
SUMMARY:M&M CIQTEK After Hours Technical Talk
DESCRIPTION:Unlocking High-Resolution Imaging with the CIQTEK HEM6000 FE-SEM\nDate\nMonday\, August 3\, 2026 \nTime\nAfter Exhibit Hall Hours (5:45 PM – 6:45 PM) \nLocation\nM&M – Booth #718 \nOverview\nJoin JH Technologies and CIQTEK for an exclusive after-hours technical presentation showcasing the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). \nThis presentation will demonstrate how high-resolution field emission SEM technology supports advanced materials characterization\, semiconductor inspection\, nanotechnology research\, and failure analysis. \nAttendees will gain valuable insights into imaging performance\, analytical capabilities\, and practical applications from microscopy experts. \nTopics Covered\n\nField Emission SEM Fundamentals\nHigh-Resolution Imaging\nSurface & Microstructure Analysis\nSemiconductor Applications\nMaterials Characterization\nFailure Analysis\nLive Questions & Discussion\n\nIdeal For\n\nSemiconductor Manufacturing\nResearch Laboratories\nUniversities\nMaterials Science\nNanotechnology\nElectronics\nFailure Analysis\nIndustrial R&D\n\nWhy Attend?\n\nLearn from microscopy experts\nExplore advanced FE-SEM capabilities\nSee real application examples\nNetwork with fellow researchers and engineers\nAsk technical questions during the discussion
URL:https://www.jhtechnologies.com/event/mm-ciqtek-after-hours-technical-talk/
ATTACH;FMTTYPE=image/png:https://www.jhtechnologies.com/wp-content/uploads/2026/07/ChatGPT-Image-Jul-9-2026-10_18_11-AM.png
END:VEVENT
END:VCALENDAR