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SUMMARY:Sample Prep Workshop Using Leica UC Enuity
DESCRIPTION:October 27–30\, 2026JH Technologies | 213 Hammond Ave.\, Fremont\, CA 94539 \nJoin JH Technologies and Leica for a hands-on workshop focused on best practices for TEM\, SEM\, and AFM sample preparation using the Leica UC Enuity Ultramicrotome. \nThis technical workshop will combine expert instruction\, demonstrations\, and hands-on sample preparation. Attendees will explore ultra-thin sectioning\, block-face preparation\, cryo-sectioning\, and failure analysis\, with opportunities to evaluate prepared samples using optical microscopy and SEM imaging. \nWorkshop Schedule\nTuesday\, October 27 – Thursday\, October 29 \n\n9:00 AM–12:00 PM\n1:00 PM–4:00 PM\n\nFriday\, October 30 \n\n9:00 AM–12:00 PM\n\nEach session will include approximately 30 minutes of technical instruction followed by demonstrations and hands-on activities. \nAttendance is limited to 5 participants per session. \nIndustry Experts\nHelmut GnaegiManaging Director of Diatome Diamond Knives and a renowned expert in ultramicrotomy and sectioning. \nSeth VillarrealLeica expert and workshop speaker specializing in Leica sample preparation technologies. \nLeica Enuity Ultramicrotome\nAttendees will have the opportunity to work with the Leica Enuity Ultramicrotome\, including its cryo-sectioning capability. JH Technologies will also provide optical microscopy and SEM capabilities for imaging and evaluating prepared samples. \nTopics We Will Cover\nTEM Sample PreparationLearn techniques for creating ultra-thin\, uniform sections suitable for Transmission Electron Microscopy. \nBlock-Face ImagingExplore trimming and preparation techniques for creating smooth\, flat surfaces for SEM\, AFM\, and optical microscopy. \nCryo-SectioningLearn how cryogenic sectioning can be used to prepare soft materials such as polymers\, coatings\, and elastomers. \nFailure AnalysisExplore sectioning techniques for multilayer materials and composites to evaluate adhesion\, layer thickness\, and internal structural defects. \nSample Preparation\nAttendees are welcome to bring or submit samples for sectioning during the workshop. \nPotential sample types include: \n\nPolymers\nPowders\nPaper\nSoft electronics\n\nWhy Ultramicrotomy?\nUltramicrotomy provides several advantages for materials characterization and sample preparation: \nReduced Thermal and Ion DamageUltramicrotomy does not rely on high-energy ion beams\, reducing the risk of ion-related contamination and heat-induced damage. \nLarge Sample AreasIt can produce relatively large\, homogeneous\, uniformly thin sections compared with localized FIB-prepared areas. \nSpeed and Cost EfficiencyOnce a sample is properly mounted or embedded\, multiple sequential sections can be produced efficiently. \nRegistration\nSpace is limited to max 5 participants per hands-on session. \n[REGISTER FOR THE WORKSHOP] \nFor questions about the workshop\, please contact JH Technologies. Sample requirements and shipping deadlines will be provided upon registration. \nFor questions about samples\, contact: \nMicah Harrelmharrel@jhtechnologies.com
URL:https://www.jhtechnologies.com/event/ultramicrotome-workshop-featuring-the-leica-enuity/
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