BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//JH Technologies - ECPv6.18.1//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:JH Technologies
X-ORIGINAL-URL:https://www.jhtechnologies.com
X-WR-CALDESC:Events for JH Technologies
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/Los_Angeles
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20250309T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20251102T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20260308T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20261101T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20270314T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20271107T090000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261103T080000
DTEND;TZID=America/Los_Angeles:20261103T170000
DTSTAMP:20261028T174528Z
CREATED:20261028T174528Z
LAST-MODIFIED:20261028T174528Z
UID:15519-1793692800-1793725200@www.jhtechnologies.com
SUMMARY:IMRI-CIQTEK Lunch & Learn Seminar
DESCRIPTION:From Imaging Instrument to Integrated Characterization Platform: Future Directions in SEM\, FIB\, and Correlative Microscopy\nJoin us for an informative Lunch & Learn seminar featuring Luke Xin Ren\, Application Director at CIQTEK America\, as he explores the future of scanning electron microscopy (SEM)\, focused ion beam (FIB) technology\, and correlative microscopy. \nThis presentation will examine how microscopy is evolving beyond traditional imaging toward integrated characterization platforms that combine multiple analytical capabilities to provide a more comprehensive understanding of materials and samples. \nEvent Details\nDate: November 3\, 2026\nTime: 11:00 AM – 2:00 PM\nLocation: 2430 Engineering Hall \nSpeaker: Luke Xin Ren\nTitle: Application Director\, CIQTEK America \nWhat to Expect\nDuring this seminar\, attendees will learn about emerging directions in microscopy and characterization\, including: \n\nThe evolution of SEM from imaging tools to integrated characterization platforms\nAdvances in FIB technology and its role in materials analysis\nCorrelative microscopy and combining multiple imaging and analytical techniques\nFuture trends in microscopy instrumentation and workflow integration\nHow integrated characterization approaches can improve sample analysis and research capabilities\n\nWhether you work in materials science\, semiconductor research\, life sciences\, or other fields that rely on advanced microscopy\, this seminar offers an opportunity to learn about the latest developments and future possibilities in microscopy and characterization. \nJoin Us\nDon’t miss this opportunity to hear from CIQTEK’s application expert and learn how the next generation of microscopy technologies is shaping the future of scientific characterization. \nNovember 3 | 11:00 AM – 2:00 PM\n2430 Engineering Hall \nRegister today to reserve your spot.
URL:https://www.jhtechnologies.com/event/imri-ciqtek-lunch-learn-seminar/
END:VEVENT
END:VCALENDAR