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X-WR-CALDESC:Events for JH Technologies
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DTSTART;VALUE=DATE:20261001
DTEND;VALUE=DATE:20261003
DTSTAMP:20260930T194335Z
CREATED:20260909T191625Z
LAST-MODIFIED:20260930T194335Z
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SUMMARY:AReMS Annual Fall Meeting 2026
DESCRIPTION:2026 AReMS Annual Fall Meeting \nOctober 1–2\, 2026 \nJH Technologies is excited to participate in the 2026 Appalachian Regional Microscopy Society (AReMS) Annual Fall Meeting\, alongside our supplier CIQTEK. \nThis year\, JH Technologies will have its own booth\, giving attendees the opportunity to meet directly with our team and explore the microscopy\, imaging\, and materials characterization solutions we represent. \nCIQTEK will also be participating\, bringing its advanced electron microscopy solutions to the meeting. \nAReMS provides an opportunity for researchers\, students\, scientists\, and industry professionals to connect\, share technical knowledge\, and discuss the latest developments in microscopy and microanalysis. \nVisit JH Technologies to: \n\nMeet our team and discuss your microscopy needs\nLearn about our portfolio of microscopy and characterization solutions\nConnect with CIQTEK\nExplore solutions for materials science\, research\, and imaging applications\n\n📅 October 1–2\, 2026📍 2026 AReMS Annual Fall Meeting \nWe’d love to see you at the JH Technologies booth! \nLearn more about AReMS \n 
URL:https://www.jhtechnologies.com/event/arems-2026/
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BEGIN:VEVENT
DTSTART;VALUE=DATE:20261004
DTEND;VALUE=DATE:20261009
DTSTAMP:20260909T192535Z
CREATED:20260909T192342Z
LAST-MODIFIED:20260909T192535Z
UID:15241-1791072000-1791503999@www.jhtechnologies.com
SUMMARY:ISTFA 2026
DESCRIPTION:ISTFA 2026 — International Symposium for Testing and Failure Analysis \nOctober 4–8\, 2026Henry B. González Convention Center | San Antonio\, Texas \nJH Technologies is excited to announce that our supplier\, CIQTEK\, will be participating in ISTFA 2026\, the 52nd International Symposium for Testing and Failure Analysis. \nISTFA brings together professionals from across the microelectronics failure analysis community to exchange knowledge\, explore emerging technologies\, and discuss techniques for testing\, characterization\, and failure analysis. \nCIQTEK’s electron microscopy solutions are designed to support demanding materials characterization and failure analysis workflows\, providing researchers and engineers with powerful imaging and analytical capabilities. \nVisit CIQTEK during ISTFA to learn more about their SEM solutions and discuss how advanced electron microscopy can support your failure analysis workflow. \n📍 Henry B. González Convention CenterSan Antonio\, TX📅 October 4–8\, 2026 \nLearn more about ISTFA 2026 \nISTFA’s 2026 technical program includes topics spanning microscopy\, package analysis\, defect localization\, nanoprobing\, sample preparation\, device analysis\, AI applications for failure analysis\, and materials characterization.
URL:https://www.jhtechnologies.com/event/istfa-2026-2/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261009T080000
DTEND;TZID=America/Los_Angeles:20261009T170000
DTSTAMP:20260909T194033Z
CREATED:20260909T194033Z
LAST-MODIFIED:20260909T194033Z
UID:15253-1791532800-1791565200@www.jhtechnologies.com
SUMMARY:2026 Great Lakes Microscopy Society Annual Meeting
DESCRIPTION:2026 Great Lakes Microscopy Society Annual Meeting \nOctober 9\, 2026Michigan Technological University | Houghton\, Michigan \nJH Technologies is pleased to announce that our supplier\, CIQTEK\, will be participating in the 2026 Great Lakes Microscopy Society (GLMS) Annual Meeting. \nThe GLMS Annual Meeting brings together researchers\, students\, scientists\, and microscopy professionals from across the Great Lakes region to share research\, explore new microscopy and microanalysis techniques\, and connect with colleagues across the field. \nCIQTEK will be on site to showcase its advanced electron microscopy solutions and discuss how modern SEM technology can support applications in materials science\, biological science\, microanalysis\, and research. \nWhether you’re working with challenging samples\, looking for higher-resolution imaging\, or exploring new microscopy capabilities\, this is a great opportunity to connect with the CIQTEK team and learn more about their technology. \nMeet CIQTEK at GLMS 2026 and discover what’s possible with advanced electron microscopy. \n📍 Michigan Technological University📅 October 9\, 2026 \nREGISTER HERE \nThe meeting covers microscopy\, microanalysis\, imaging\, and related research across materials science\, engineering\, biological sciences\, chemistry\, and more.
URL:https://www.jhtechnologies.com/event/2026-great-lakes-microscopy-society-annual-meeting/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261013T080000
DTEND;TZID=America/Los_Angeles:20261015T170000
DTSTAMP:20260429T202432Z
CREATED:20260429T202419Z
LAST-MODIFIED:20260429T202432Z
UID:14336-1791878400-1792083600@www.jhtechnologies.com
SUMMARY:SEMICON West 2026
DESCRIPTION:SEMICON West 2026\nOctober 13–15 | Moscone Center | San Francisco\, CA\nSEMICON West 2026 returns to San Francisco\, CA\, bringing together the world’s leading innovators\, engineers\, executives\, and decision-makers across the microelectronics supply chain. \nHosted at the iconic Moscone Center\, this flagship event is the ultimate platform to explore the technologies\, partnerships\, and strategies shaping the future of semiconductor manufacturing. \nBe part of the conversations\, technologies\, and partnerships that will define the next era of microelectronics. Join us October 13–15\, 2026!
URL:https://www.jhtechnologies.com/event/semicon-west/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261027T090000
DTEND;TZID=America/Los_Angeles:20261030T170000
DTSTAMP:20260902T203316Z
CREATED:20260819T221106Z
LAST-MODIFIED:20260902T203316Z
UID:15089-1793091600-1793379600@www.jhtechnologies.com
SUMMARY:Sample Prep Workshop Using Leica UC Enuity
DESCRIPTION:October 27–30\, 2026JH Technologies | 213 Hammond Ave.\, Fremont\, CA 94539 \nJoin JH Technologies and Leica for a hands-on workshop focused on best practices for TEM\, SEM\, and AFM sample preparation using the Leica UC Enuity Ultramicrotome. \nThis technical workshop will combine expert instruction\, demonstrations\, and hands-on sample preparation. Attendees will explore ultra-thin sectioning\, block-face preparation\, cryo-sectioning\, and failure analysis\, with opportunities to evaluate prepared samples using optical microscopy and SEM imaging. \nWorkshop Schedule\nTuesday\, October 27 – Thursday\, October 29 \n\n9:00 AM–12:00 PM\n1:00 PM–4:00 PM\n\nFriday\, October 30 \n\n9:00 AM–12:00 PM\n\nEach session will include approximately 30 minutes of technical instruction followed by demonstrations and hands-on activities. \nAttendance is limited to 5 participants per session. \nIndustry Experts\nHelmut GnaegiManaging Director of Diatome Diamond Knives and a renowned expert in ultramicrotomy and sectioning. \nSeth VillarrealLeica expert and workshop speaker specializing in Leica sample preparation technologies. \nLeica Enuity Ultramicrotome\nAttendees will have the opportunity to work with the Leica Enuity Ultramicrotome\, including its cryo-sectioning capability. JH Technologies will also provide optical microscopy and SEM capabilities for imaging and evaluating prepared samples. \nTopics We Will Cover\nTEM Sample PreparationLearn techniques for creating ultra-thin\, uniform sections suitable for Transmission Electron Microscopy. \nBlock-Face ImagingExplore trimming and preparation techniques for creating smooth\, flat surfaces for SEM\, AFM\, and optical microscopy. \nCryo-SectioningLearn how cryogenic sectioning can be used to prepare soft materials such as polymers\, coatings\, and elastomers. \nFailure AnalysisExplore sectioning techniques for multilayer materials and composites to evaluate adhesion\, layer thickness\, and internal structural defects. \nSample Preparation\nAttendees are welcome to bring or submit samples for sectioning during the workshop. \nPotential sample types include: \n\nPolymers\nPowders\nPaper\nSoft electronics\n\nWhy Ultramicrotomy?\nUltramicrotomy provides several advantages for materials characterization and sample preparation: \nReduced Thermal and Ion DamageUltramicrotomy does not rely on high-energy ion beams\, reducing the risk of ion-related contamination and heat-induced damage. \nLarge Sample AreasIt can produce relatively large\, homogeneous\, uniformly thin sections compared with localized FIB-prepared areas. \nSpeed and Cost EfficiencyOnce a sample is properly mounted or embedded\, multiple sequential sections can be produced efficiently. \nRegistration\nSpace is limited to max 5 participants per hands-on session. \n[REGISTER FOR THE WORKSHOP] \nFor questions about the workshop\, please contact JH Technologies. Sample requirements and shipping deadlines will be provided upon registration. \nFor questions about samples\, contact: \nMicah Harrelmharrel@jhtechnologies.com
URL:https://www.jhtechnologies.com/event/ultramicrotome-workshop-featuring-the-leica-enuity/
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DTSTART;TZID=America/Los_Angeles:20261105T100000
DTEND;TZID=America/Los_Angeles:20261105T150000
DTSTAMP:20260916T191746Z
CREATED:20260819T220800Z
LAST-MODIFIED:20260916T191746Z
UID:15087-1793872800-1793890800@www.jhtechnologies.com
SUMMARY:Workshop – Bruker eWarp EBSD in Fremont
DESCRIPTION:Join JH Technologies and Bruker for an upcoming workshop focused on Electron Backscatter Diffraction (EBSD) and its applications in materials characterization. \nLearn more about how EBSD can be used to analyze crystallographic orientation\, grain structure\, phase distribution\, and other microstructural features. This workshop will provide an opportunity to explore EBSD technology and gain insight into how it can support advanced materials research and analysis. \nDate : Nov 5\nLocation: 213 Hammond Ave\, Fremont\, CA\nTime : 10:00 AM – 3:00 PM (Pacific Time) \nLunch Included \nObjectives: \n\nUnderstand the principles and applications of EBSD.\nStep-by-step sample preparation for EBSD.\nRecognize the best SEM configurations and understand the advantages and limitations of EBSD detectors and data collection capabilities.\nAcquire and process EBSD datasets.\nInterpret and visualize EBSD results for microstructural analysis.\n\nA day filled with learning and networking. Whether you’re a beginner or an expert\, this workshop is perfect for anyone interested in EBSD technology. Don’t miss this opportunity to enhance your skills and connect with fellow enthusiasts. See you there! Space is limited— \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/learn-about-ebsd-at-our-upcoming-bruker-workshop/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261110T080000
DTEND;TZID=America/Los_Angeles:20261111T170000
DTSTAMP:20260910T210145Z
CREATED:20260429T203535Z
LAST-MODIFIED:20260910T210145Z
UID:14339-1794297600-1794416400@www.jhtechnologies.com
SUMMARY:AEMS 2026
DESCRIPTION:AEMS 2026 — Anaheim Electronics & Manufacturing Show\nNovember 10–11\, 2026Anaheim Convention Center | Anaheim\, CAJH Technologies — Booth 513 \nJoin JH Technologies at AEMS 2026\, the Anaheim Electronics & Manufacturing Show\, where we’ll showcase microscopy\, imaging\, metrology\, and inspection solutions for today’s advanced manufacturing and technology applications. \nVisit us at Booth 513 to explore solutions from leading manufacturers\, including Leica Microsystems\, Sensofar\, COXEM\, and more. \nExplore Solutions For\n\nElectronics & semiconductor applications\nManufacturing inspection\nMaterials characterization\nSurface measurement & 3D metrology\nFailure analysis\nMicroscopy & imaging\n\nWhether you’re looking for high-resolution imaging\, dimensional measurement\, surface characterization\, or inspection solutions\, our team is available to discuss your application and help identify the right technology for your needs. \nVisit JH Technologies at Booth 513\nNovember 10: 10:00 AM–5:00 PMNovember 11: 10:00 AM–2:00 PM \n📍 Anaheim Convention CenterAnaheim\, California \nStop by Booth 513 to see the technology up close and talk with our team. \nFeatured Manufacturers\nLeica Microsystems | Sensofar | COXEM | and more \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/aems-2026/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261129T080000
DTEND;TZID=America/Los_Angeles:20261204T170000
DTSTAMP:20260429T203839Z
CREATED:20260429T203839Z
LAST-MODIFIED:20260429T203839Z
UID:14343-1795939200-1796403600@www.jhtechnologies.com
SUMMARY:2026 MRS Fall Meeting & Exhibit
DESCRIPTION:2026 MRS Fall Meeting & Exhibit\nThe 2026 MRS Fall Meeting & Exhibit will take place November 29-December 5\, 2026 in Boston\, Massachusetts\, at the Hynes Convention Center and adjacent Sheraton Boston Hotel. \nNovember 29 – December 4\, 2026\nBoston\, Massachusetts\n\nAbstract Submission Opens May 2026
URL:https://www.jhtechnologies.com/event/2026-mrs-fall-meeting-exhibit/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261203T080000
DTEND;TZID=America/Los_Angeles:20261203T170000
DTSTAMP:20260429T203707Z
CREATED:20260429T203707Z
LAST-MODIFIED:20260429T203707Z
UID:14341-1796284800-1796317200@www.jhtechnologies.com
SUMMARY:SMTA Silicon Valley
DESCRIPTION:Plan now to join us for free technical sessions\, free lunch and the chance to network with leading suppliers to our industry! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/smta-silicon-valley/
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