BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//JH Technologies - ECPv6.18.1//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:JH Technologies
X-ORIGINAL-URL:https://www.jhtechnologies.com
X-WR-CALDESC:Events for JH Technologies
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/Los_Angeles
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20240310T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20241103T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20250309T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20251102T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20260308T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20261101T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20270314T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20271107T090000
END:STANDARD
END:VTIMEZONE
BEGIN:VTIMEZONE
TZID:Europe/London
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20240331T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20241027T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20250330T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20251026T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20260329T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20261025T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260923T080000
DTEND;TZID=America/Los_Angeles:20260923T170000
DTSTAMP:20260917T192502Z
CREATED:20260818T205143Z
LAST-MODIFIED:20260917T192502Z
UID:15075-1790150400-1790182800@www.jhtechnologies.com
SUMMARY:NW Electronics Design & Manufacturing Expo (NEDME) 2026
DESCRIPTION:Join JH Technologies at the NW Electronics Design & Manufacturing Expo (NEDME) in Portland for an exciting showcase of advanced microscopy\, inspection\, and analytical solutions for electronics and manufacturing applications. \nVisit JH Technologies at Booth 606 to explore our featured technologies from XAVIS\, Leica Microsystems\, and COXEM\, and connect with our team to discuss solutions for your inspection\, analysis\, and manufacturing needs. \nOur Open House Is Coming to NEDME!\nThis year\, we’re bringing our annual JH Technologies Open House directly to NEDME! Instead of hosting a separate event in Portland\, we’ll be bringing the Open House experience to our booth so you can meet our team\, explore our technologies\, and see what’s new—all in one place. \nREGISTER HERE \nWe look forward to seeing you at NEDME 2026\, Booth 606!
URL:https://www.jhtechnologies.com/event/nw-electronics-design-manufacturing-expo-nedme-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260914T080000
DTEND;TZID=America/Los_Angeles:20260919T170000
DTSTAMP:20260818T203502Z
CREATED:20260818T203413Z
LAST-MODIFIED:20260818T203502Z
UID:15070-1789372800-1789837200@www.jhtechnologies.com
SUMMARY:IMTS 2026
DESCRIPTION:Join JH Technologies at IMTS 2026 in Chicago to explore advanced microscopy\, metrology\, and inspection solutions for precision manufacturing and quality control. \nVisit our partners at their booths to see the latest technologies and learn how advanced imaging\, 3D optical profiling\, and measurement solutions can support your manufacturing applications. \nFeatured Exhibitors & Booths \n\nLeica Microsystems — Booth 134266\nMitutoyo — Booth 134117\nSensofar — Booth 134045\n\nStop by their booths to connect with our team and discover the latest solutions for surface measurement\, optical inspection\, and precision manufacturing.
URL:https://www.jhtechnologies.com/event/imts-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260901T100000
DTEND;TZID=America/Los_Angeles:20260901T103000
DTSTAMP:20260819T220236Z
CREATED:20260819T220236Z
LAST-MODIFIED:20260819T220236Z
UID:15084-1788256800-1788258600@www.jhtechnologies.com
SUMMARY:Join Sensofar Event 26
DESCRIPTION:Be among the first to discover what’s next in optical metrology—and stay tuned as JH Technologies prepares to bring new surface profiling capabilities to our Analytical Lab later this year. \n[Register for the Sensofar Event 26]\nRegister here: https://www.sensofar.com/metrology/webinars/sensofar-event-26/ \nAfter the announcement\, check back with JH Technologies for more information about our upcoming surface profiling system and how you may be able to experience the latest technology firsthand. \nWhat You’ll Discover\nIn one focused 20-minute session\, discover how Sensofar is moving surface measurement forward and what this evolution could mean for your daily metrology work. \nA new development in 3D optical metrology\nBe among the first to see the latest addition to Sensofar’s optical metrology portfolio. \nA more intuitive metrology experience\nDiscover how measurement workflows can become easier to operate\, understand\, and control.
URL:https://www.jhtechnologies.com/event/join-sensofar-event-26/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260804T103000
DTEND;TZID=America/Los_Angeles:20260805T170000
DTSTAMP:20260710T185144Z
CREATED:20260710T185144Z
LAST-MODIFIED:20260710T185144Z
UID:15038-1785839400-1785949200@www.jhtechnologies.com
SUMMARY:COXEM Lunch & Learn Low Vacuum SEM Imaging
DESCRIPTION:Date \n\nTuesday\, August 4\, 2026\nWednesday\, August 5\, 2026\n\nTime\n11:30 AM – 12:00 PM \nLocation\nCOXEM Booth\nM&M 2026 Exhibit Hall \nOverview\nJoin JH Technologies for a complimentary Lunch & Learn featuring the COXEM EM-40 Tabletop Scanning Electron Microscope. This 30-minute presentation will explore how low vacuum imaging enables fast\, efficient imaging of non-conductive and challenging samples with minimal preparation. \nPerfect for users in research\, manufacturing\, quality control\, education\, and failure analysis\, this session will provide practical insights into improving workflow efficiency while maintaining excellent imaging performance. \nIdeal For\n\nMaterials Science\nMetallurgy\nPolymers & Plastics\nGeology & Minerals\nPharmaceuticals\nFibers & Textiles\nEducation\nFailure Analysis\nQuality Assurance\n\n🍽️ Complimentary lunch will be provided to registered attendees while supplies last. \nReserve Your Seat \n[Register Now]
URL:https://www.jhtechnologies.com/event/coxem-lunch-learn-low-vacuum-sem-imaging/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260803T173000
DTEND;TZID=America/Los_Angeles:20260803T180000
DTSTAMP:20260723T204816Z
CREATED:20260723T204816Z
LAST-MODIFIED:20260723T204816Z
UID:15045-1785778200-1785780000@www.jhtechnologies.com
SUMMARY:M&M CIQTEK Vendor Tutorial: Unlocking the Power of High-Speed SEM
DESCRIPTION:Join JH Technologies and CIQTEK After Hours at M&M 2026\n📅 Monday\, August 3\, 2026🕔 5:45 PM – 6:45 PM📍 Baird Center | Milwaukee\, WI📌 M&M 2026 | Booth 718 \n\nAbout the Event\nJoin JH Technologies and CIQTEK after exhibit hall hours at the Microscopy & Microanalysis 2026 Conference for an evening technical presentation highlighting the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). \nThis technical presentation will explore how advanced\, high-speed scanning electron microscopy can deliver superb imaging resolution at low kV while supporting large-scale volume microscopy applications. \nDiscover how the CIQTEK HEM6000 is helping advance imaging and analysis in a range of demanding applications\, including: \n\n🔬 Materials characterization\n⚙️ Failure analysis\n💻 Semiconductor inspection\n🧪 Research and development\n🧬 Large-scale volume microscopy\n\nWhether you are exploring new microscopy technologies or looking to enhance your current imaging capabilities\, this presentation offers an opportunity to learn more about the performance and versatility of advanced FE-SEM technology. \nWe look forward to seeing you there!\n\nEvent Details\nEvent: CIQTEK Vendor TutorialTopic: Unlocking the Power of High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low KV for Large Scale Volume Microscopy Applications from CIQTEKDate: Monday\, August 3\, 2026Time: 5:45 PM – 6:45 PMLocation: Baird Center\, Milwaukee\, WIBooth: 718
URL:https://www.jhtechnologies.com/event/mm-ciqtek-vendor-tutorial-unlocking-the-power-of-high-speed-sem/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260802T080000
DTEND;TZID=America/Los_Angeles:20260805T170000
DTSTAMP:20260429T202656Z
CREATED:20260429T202236Z
LAST-MODIFIED:20260429T202656Z
UID:14333-1785657600-1785949200@www.jhtechnologies.com
SUMMARY:M&M 2026
DESCRIPTION:M&M 2026 \nBaird Center | Milwaukee\, WI I August 2-6\, 2026 \n\n\n\n\n\nJoin us at the Baird Center in Milwaukee\, WI for M&M 2026. The world’s leading annual forum for the science and technology of microscopy and microanalysis.\n\n\nREGISTER HERE\n\n\n 
URL:https://www.jhtechnologies.com/event/14333/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260703T173000
DTEND;TZID=America/Los_Angeles:20260703T183000
DTSTAMP:20260710T185700Z
CREATED:20260710T185700Z
LAST-MODIFIED:20260710T185700Z
UID:15041-1783099800-1783103400@www.jhtechnologies.com
SUMMARY:M&M CIQTEK After Hours Technical Talk
DESCRIPTION:Unlocking High-Resolution Imaging with the CIQTEK HEM6000 FE-SEM\nDate\nMonday\, August 3\, 2026 \nTime\nAfter Exhibit Hall Hours (5:45 PM – 6:45 PM) \nLocation\nM&M – Booth #718 \nOverview\nJoin JH Technologies and CIQTEK for an exclusive after-hours technical presentation showcasing the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). \nThis presentation will demonstrate how high-resolution field emission SEM technology supports advanced materials characterization\, semiconductor inspection\, nanotechnology research\, and failure analysis. \nAttendees will gain valuable insights into imaging performance\, analytical capabilities\, and practical applications from microscopy experts. \nTopics Covered\n\nField Emission SEM Fundamentals\nHigh-Resolution Imaging\nSurface & Microstructure Analysis\nSemiconductor Applications\nMaterials Characterization\nFailure Analysis\nLive Questions & Discussion\n\nIdeal For\n\nSemiconductor Manufacturing\nResearch Laboratories\nUniversities\nMaterials Science\nNanotechnology\nElectronics\nFailure Analysis\nIndustrial R&D\n\nWhy Attend?\n\nLearn from microscopy experts\nExplore advanced FE-SEM capabilities\nSee real application examples\nNetwork with fellow researchers and engineers\nAsk technical questions during the discussion
URL:https://www.jhtechnologies.com/event/mm-ciqtek-after-hours-technical-talk/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260625T080000
DTEND;TZID=America/Los_Angeles:20260629T170000
DTSTAMP:20251219T002550Z
CREATED:20251219T002257Z
LAST-MODIFIED:20251219T002550Z
UID:13612-1782374400-1782752400@www.jhtechnologies.com
SUMMARY:Microscopy Society of Canada - IUMAS
DESCRIPTION:The MSC-SMC encourages networking and sharing of knowledge between scientists\, corporations\, students and retired members. PROMOTING MICROSCOPY SINCE 1972. \nSay Hi to our JH Team at the Ciqtek booth! \nREGISTER HERE!  \n 
URL:https://www.jhtechnologies.com/event/microscopy-society-of-canada-iumas/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260603T090000
DTEND;TZID=America/Los_Angeles:20260603T170000
DTSTAMP:20260414T171502Z
CREATED:20260225T211749Z
LAST-MODIFIED:20260414T171502Z
UID:13960-1780477200-1780506000@www.jhtechnologies.com
SUMMARY:Open House Nashua 2026
DESCRIPTION: 11 Trafalgar Square\, Suite 103\, Nashua\, NH 03063 \n\nYou’re invited to our New England Open House! \nJoin us in our Nashua showroom for a day of learning\, networking\, and live demonstrations. This special event will showcase new lab applications and include an exclusive remote demo on X-ray technology. \nEvent Highlights:\n➔ Remote X-ray Demo – Discover the latest innovations in imaging and analysis➔ Hands-On Product Demos – Explore new lab applications and solutions➔ Networking Opportunities – Connect with industry peers and JH Technologies experts➔ Complimentary Lunch – Enjoy a meal on us while you explore what’s new \nCome see how our advanced tools and expertise can support your work and help you stay ahead in your field. \n Register today to secure your spot—space is limited! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/open-house-nashua-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260528T090000
DTEND;TZID=America/Los_Angeles:20260528T180000
DTSTAMP:20260416T162618Z
CREATED:20260408T203918Z
LAST-MODIFIED:20260416T162618Z
UID:14152-1779958800-1779991200@www.jhtechnologies.com
SUMMARY:JH Technologies Fremont Open House
DESCRIPTION:Join us for an exciting\, hands-on Open House at JH Technologies in Fremont! This one-day event brings together cutting-edge microscopy\, metrology\, and imaging solutions—along with live demos\, expert talks\, and a chance to influence product development. \n \n📅 Date: Thursday\, May 28. 9AM – 6PM📍 Location: JH Technologies – 213 Hammond Avenue\, Fremont\, CA 94539🍽️ Perk: Free lunch provided \n🔬 What to Expect\n\nExpert Talk by CIQTEK\n\nLearn about EBSD (Electron Backscatter Diffraction)\nPresented by our in-house SEM application experts\n\n\nLive Demo from Xavis\n\nExplore the XScan product line in action\nSee real-time inspection capabilities\n\n\nInteractive Demo by Sensofar\n\nLive demo of the S lynx 2 system\nFirst look at newly released software features\n\n\n🚨Leica Product Beta Test Opportunity\n\nDigital imaging technology\, the new wave\nSee\, experience\, and get a chance to shape product development\n\n\n\n🎯 Why Attend?\n\nConnect with industry experts\nExperience live\, hands-on demonstrations\nDiscover the latest in microscopy and imaging technology\nNetwork with peers in your field\n\nREGISTER HERE
URL:https://www.jhtechnologies.com/event/jh-technologies-fremont-open-house/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260520T080000
DTEND;TZID=America/Los_Angeles:20260520T170000
DTSTAMP:20260429T201511Z
CREATED:20260429T201511Z
LAST-MODIFIED:20260429T201511Z
UID:14331-1779264000-1779296400@www.jhtechnologies.com
SUMMARY:Microscopy Society of Northeastern Ohio
DESCRIPTION:THE 68 TH ANNUAL MAY MEETING CONFERENCE\nWEDNESDAY  MAY 20\, 2026– DOLAN SCIENCE CENTER\, JOHN CARROLL UNIVERSITY\n  \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/microscopy-society-of-northeastern-ohio/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260520T060000
DTEND;TZID=America/Los_Angeles:20260520T133000
DTSTAMP:20260506T212859Z
CREATED:20260506T212822Z
LAST-MODIFIED:20260506T212859Z
UID:14371-1779256800-1779283800@www.jhtechnologies.com
SUMMARY:Sensofar Workshop - Beyond Roughness: Linking Surface Texture
DESCRIPTION:Join us in East Hartford for an exclusive\, in-person workshop hosted by CCAT in partnership with Sensofar\, focused on understanding how surface texture directly impacts real-world product performance. \nThis session goes beyond traditional roughness measurements to explore how microscopic surface geometries influence critical functional properties such as durability\, friction\, sealing\, adhesion\, and resistance to cracking. Attendees will gain practical insight into advanced 3D surface measurement and texture analysis\, supported by real-world case studies that connect data to performance outcomes. \nThe workshop features a presentation by industry expert Mark Malburg\, along with live demonstrations\, an exclusive ATC facility tour\, and opportunities for networking. Participants are also encouraged to bring their own parts for onsite measurement and evaluation by local experts. \n📅 May 20 | 9:00 AM – 1:15 PM EST📍 CCAT – East Hartford\, CT \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/sensofar-workshop-beyond-roughness-linking-surface-texture/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260517T080000
DTEND;TZID=America/Los_Angeles:20260519T170000
DTSTAMP:20260429T201226Z
CREATED:20260429T201226Z
LAST-MODIFIED:20260429T201226Z
UID:14329-1779004800-1779210000@www.jhtechnologies.com
SUMMARY:Mid-Atlantic Regional Microscopy & Microanalysis Symposium & PSM
DESCRIPTION:May 17-19 \nSpeakers from the Smithsonian Institution\, the University of Delaware\, and other institutions from the Mid-Atlantic region will present work illustrating how microscopy contributes to biological and physical science research.
URL:https://www.jhtechnologies.com/event/mid-atlantic-regional-microscopy-microanalysis-symposium-psm/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260514T110000
DTEND;TZID=America/Los_Angeles:20260514T120000
DTSTAMP:20260414T220252Z
CREATED:20260305T230652Z
LAST-MODIFIED:20260414T220252Z
UID:14005-1778756400-1778760000@www.jhtechnologies.com
SUMMARY:Webinar: Cone Beam CT vs. Oblique CT
DESCRIPTION:📅 Date: May 14\n🎤 Speaker: Yifan Jiang\n💬 Live Q&A: Yifan Jiang and Tim Schoen \nIn this session\, Yifan will walk through real-world examples of how X-ray CT helps reveal hidden issues such as solder voids\, cracks\, delamination\, and internal structural defects in electronic devices. Attendees will gain practical insights into how CT imaging can improve failure diagnostics\, quality control\, and product development. \nTim will also join the session to assist with the live Q&A\, helping answer audience questions about CT workflows\, applications\, and best practices. \nWhat You’ll Learn\n\nHow X-ray CT works for non-destructive electronic inspection\nCommon electronic failure modes detected with CT\nHow CT reveals internal defects invisible to traditional inspection methods\nPractical examples of CT imaging in electronic failure analysis\nWhen CT should be used alongside other analytical techniques\n\nThis webinar is ideal for engineers\, failure analysis specialists\, quality engineers\, and researchers working with electronic devices and assemblies. \nStay until the end for a live Q&A session where you can ask questions and discuss your specific applications with our experts. \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/webinar-x-ray-ct-applications-for-electronic-failure-analysis/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260511T080000
DTEND;TZID=America/Los_Angeles:20260513T170000
DTSTAMP:20251219T001041Z
CREATED:20251219T001041Z
LAST-MODIFIED:20251219T001041Z
UID:13608-1778486400-1778691600@www.jhtechnologies.com
SUMMARY:SEMS Microscopy Society
DESCRIPTION:Location: Athens\, Georgia USA \nSEMS 61th annual meeting will be held May 11- 13\, 2026 at the University of Georgia Center for Continuing Education and Hotel 1197 South Lumpkin Street\, Athens\, Georgia 30602. Book your group rate for the Southeastern Microscopy Society\, Athens. Say hi to our JH Team! \nREGISTER HERE! \n 
URL:https://www.jhtechnologies.com/event/sems-microscopy-society/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260426T080000
DTEND;TZID=America/Los_Angeles:20260501T170000
DTSTAMP:20251219T000448Z
CREATED:20251219T000448Z
LAST-MODIFIED:20251219T000448Z
UID:13601-1777190400-1777654800@www.jhtechnologies.com
SUMMARY:MRS Spring Meeting 2026
DESCRIPTION:MRS Spring Meeting \nFrom April 7–11\, 2025\, over 4\,000 researchers gathered in Seattle for the MRS Spring Meeting & Exhibit to share developments across disciplines. Held at the Summit—the Seattle Convention Center’s new addition—and the Hyatt Regency\, the event showcased the power of interdisciplinary collaboration. \nSay Hi to our JH TEAM! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/mrs-spring-meeting-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260422T070000
DTEND;TZID=America/Los_Angeles:20260422T080000
DTSTAMP:20260331T000202Z
CREATED:20260331T000202Z
LAST-MODIFIED:20260331T000202Z
UID:14082-1776841200-1776844800@www.jhtechnologies.com
SUMMARY:Sensofar Webinar - Engineering confidence in Precision Manufacturing
DESCRIPTION:Join JH Technologies and Sensofar this Earth Day – April 22\, CEST time 4 pm or an insightful webinar on how advanced optical 3D metrology is shaping the future of precision manufacturing. As components become more complex\, accurate measurement is critical to ensuring performance\, reducing material waste\, and improving overall product quality. \nThis session will explore practical strategies for evaluating geometry\, surface functionality\, and durability—helping engineers and researchers make more informed decisions while supporting more efficient and sustainable manufacturing processes. \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/sensofar-webinar-engineering-confidence-in-precision-manufacturing/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260317T080000
DTEND;TZID=America/Los_Angeles:20260319T170000
DTSTAMP:20251219T000241Z
CREATED:20251219T000217Z
LAST-MODIFIED:20251219T000241Z
UID:13597-1773734400-1773939600@www.jhtechnologies.com
SUMMARY:APEX 2026
DESCRIPTION:APEX EXPO is the premier event in North America for the electronics industry. OEMs\, EMS providers\, PCB manufacturers and industry professionals from around the globe come together to access the latest technical content\, contribute to standards development\, and network with the industry’s largest gathering of capital equipment manufacturers\, suppliers\, and product innovators in design\, printed board manufacturing\, electronics assembly\, and test. The event offers nearly endless opportunities for education and networking. Attendees gain access to cutting-edge technologies\, advanced materials\, and the latest processes\, equipping them with the knowledge\, technical skills\, and best practices to reimagine the possibilities to drive your business forward. \nSay hi to our JH TEAM! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/apex-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260315T080000
DTEND;TZID=America/Los_Angeles:20260319T170000
DTSTAMP:20251218T234733Z
CREATED:20251218T234655Z
LAST-MODIFIED:20251218T234733Z
UID:13585-1773561600-1773939600@www.jhtechnologies.com
SUMMARY:TMS 2026 Annual Meeting & Exhibition
DESCRIPTION:March 15-19\, 2026 | San Diego Convention Center and Hilton San Diego Bayfront \nThe TMS Annual Meeting & Exhibition brings together more than 4\,000 engineers\, scientists\, business leaders\, and other professionals in the minerals\, metals\, and materials fields for a comprehensive\, cross-disciplinary exchange of technical knowledge. SAy Hi to the JH Team! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/tms-2026-annual-meeting-exhibition/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260310T080000
DTEND;TZID=America/Los_Angeles:20260310T170000
DTSTAMP:20251218T235556Z
CREATED:20251218T235106Z
LAST-MODIFIED:20251218T235556Z
UID:13593-1773129600-1773162000@www.jhtechnologies.com
SUMMARY:LAVCC STEM Day
DESCRIPTION:This competition is a multi-day event hosted by Pierce College in collaboration with LAVC and LA Mission College\, designed to engage over 400 MESA students in hands-on engineering challenges guided by NASA and industry experts. LAVC regularly hosts various STEM-related activities\, workshops\, and symposiums throughout the year. Say hi to our JH Team! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/lavcc-stem-day/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260307T080000
DTEND;TZID=America/Los_Angeles:20260311T170000
DTSTAMP:20251218T234431Z
CREATED:20251218T234431Z
LAST-MODIFIED:20251218T234431Z
UID:13582-1772870400-1773248400@www.jhtechnologies.com
SUMMARY:Pittcon 2026
DESCRIPTION:Pittcon’s industry-leading technical program and short course educational curriculum allows you to continue expanding your knowledge and grow your career to new heights. Say Hi to our JH Team! \nMarch 7-11\, 2026 | San Antonio\, TX\, USA | Henry B. González Convention Center
URL:https://www.jhtechnologies.com/event/pittcon-2026/
ATTACH;FMTTYPE=image/png:https://www.jhtechnologies.com/wp-content/uploads/2025/12/202402_Pittcon.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260304T110000
DTEND;TZID=America/Los_Angeles:20260304T113000
DTSTAMP:20260219T005606Z
CREATED:20260128T225826Z
LAST-MODIFIED:20260219T005606Z
UID:13735-1772622000-1772623800@www.jhtechnologies.com
SUMMARY:Low Vacuum vs High Vacuum SEM: When Each Mode Delivers Better Images
DESCRIPTION:Join JH Technologies for a live\, 30-minute online webinar exploring the strengths and limitations of Low Vacuum and High Vacuum SEM imaging. \nLed by JH Technologies SEM experts Yi and Ken\, this session will focus on real-world imaging scenarios\, helping attendees understand when each vacuum mode provides the best results based on sample type\, charging behavior\, and image requirements. \nThis interactive discussion is ideal for SEM users looking to improve image quality and make more confident imaging decisions. \n📅 March 4⏰ 11:00–11:30 AM PST \n\n🔗 Join the Webinar\nDirect Access Link:https://us05web.zoom.us/j/83240299035?pwd=LlVxCEsC0XKk6WaLAa9aAh49yi76U6.1 \nMeeting ID: 832 4029 9035Passcode: WjVj2E \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/low-vacuum-vs-high-vacuum-sem-when-each-mode-delivers-better-images/
ATTACH;FMTTYPE=image/jpeg:https://www.jhtechnologies.com/wp-content/uploads/2024/05/low-vac-pine-wood-1.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260219T080000
DTEND;TZID=America/Los_Angeles:20260220T170000
DTSTAMP:20251218T232730Z
CREATED:20250219T232523Z
LAST-MODIFIED:20251218T232730Z
UID:13573-1771488000-1771606800@www.jhtechnologies.com
SUMMARY:TSM- Texas Society for Microscopy
DESCRIPTION:Dates: February 19 & 20\, 2026\nLocation: University of Texas at Austin; Peter O’Donnell building (POB) \nThe 60th Anniversary TSM Meeting\, hosted by the University of Texas at Austin\, will take place on February 19 & 20\, 2026. This annual event brings together experts and enthusiasts in microscopy to share knowledge\, showcase the latest advancements\, and network with peers. Say Hi to our JH Team! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/tsm-texas-society-for-microscopy/
ATTACH;FMTTYPE=image/jpeg:https://www.jhtechnologies.com/wp-content/uploads/2025/12/9755f32f4d35763525424d0a33b28c9d.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260217T080000
DTEND;TZID=America/Los_Angeles:20260219T170000
DTSTAMP:20251218T234008Z
CREATED:20251218T234008Z
LAST-MODIFIED:20251218T234008Z
UID:13579-1771315200-1771520400@www.jhtechnologies.com
SUMMARY:SMTA-Wafer Level Packaging
DESCRIPTION:Where: Hyatt Regency San Francisco Airport\n1333 Bayshore Highway\nBurlingame\, California 94010 \nThe development of Advanced Package Technology is undergoing a massive change because Electrical System Architects are directly driving package performance requirements\, something which has never happened before. Previously System Architects designed circuits around package limitations because pushing package technologies outside of their “comfort zones” often led to undesirable results. Say hi to our JH Team!\nREGISTER HERE
URL:https://www.jhtechnologies.com/event/smta-wafer-level-packaging/
ATTACH;FMTTYPE=image/png:https://www.jhtechnologies.com/wp-content/uploads/2025/12/wlps_2026_masthead-1.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260211T100000
DTEND;TZID=America/Los_Angeles:20260211T170000
DTSTAMP:20260113T001813Z
CREATED:20260108T004838Z
LAST-MODIFIED:20260113T001813Z
UID:13626-1770804000-1770829200@www.jhtechnologies.com
SUMMARY:Equipment Showcase Event: UC Santa Barbara — Register Now
DESCRIPTION:Date and time: Feb 11\, 2026 – 10AM – 5PM\n\n\n\n\nLocation: University of California\, Santa Barbara\, CNSI Elings Hall\, room 1605\n\n\nWe’re heading to UC Santa Barbara for an on-site JH Technologies Equipment Showcase\, featuring live demonstrations and expert discussions. \nFeatured Equipment:\n• Sensofar S Lynx Optical Profiler• Coxem EM-40 Tabletop SEM• Leica Microscopes• Xavis X-ray Inspection Demo• CSI AFM Solutions \nThis is a great opportunity to see multiple technologies in action and discuss real-world applications with our team. \n REGISTER HERE
URL:https://www.jhtechnologies.com/event/roadshow-event-uc-santa-barbara-register-now/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260203T080000
DTEND;TZID=America/Los_Angeles:20260205T170000
DTSTAMP:20251218T233429Z
CREATED:20251218T230120Z
LAST-MODIFIED:20251218T233429Z
UID:13568-1770105600-1770310800@www.jhtechnologies.com
SUMMARY:MD&M West 2026
DESCRIPTION:Explore the MedTech Sector at MD&M West—where safety\, precision\, and performance define every innovation. From essential components and breakthrough technologies to the industries driving MedTech forward\, this is the hub to connect with top suppliers\, discover new solutions\, and tackle your toughest medical device challenges. Meet the professionals shaping the future of healthcare\, learn from expert-led education\, and see how MedTech integrates with other advanced manufacturing sectors\, all under one roof. \nSay Hi to the JH Team at the Leica\, Sensofar and Xavis booth! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/mdm-west-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260117T080000
DTEND;TZID=America/Los_Angeles:20260122T170000
DTSTAMP:20251218T230204Z
CREATED:20251218T202057Z
LAST-MODIFIED:20251218T230204Z
UID:13566-1768636800-1769101200@www.jhtechnologies.com
SUMMARY:SPIE Photonics West 2026
DESCRIPTION:SPIE Photonics West\nThe world’s brightest stage for photonics\, lasers\, and visionary tech. Browse the 2026 program; discover all the ways you’ll connect with colleagues\nSPIE Photonics West is the premier event for lasers\, biomedical optics\, optoelectronics\, and technologies supporting biophotonic\, quantum\, and vision applications. Say hi to the JH Team at the Sensofar booth#3681! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/spie-photonics-west-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20251204T180000
DTEND;TZID=Europe/London:20251204T190000
DTSTAMP:20251203T004918Z
CREATED:20251202T202649Z
LAST-MODIFIED:20251203T004918Z
UID:13463-1764871200-1764874800@www.jhtechnologies.com
SUMMARY:EM MicroTarget Preparation Webinar - Leica
DESCRIPTION: \n12/4/2025\n\n\nWhen:\nThursday\, December 4\, 2025\n10:00AM (US Pacific)\n\n\nWhere:\nOnline\n\n\nContact:\nJH Technologies\n\n\n\nWhy Attend?\nLearn how advanced EM preparation technologies are transforming micro target location\, alignment\, and preparation—turning complex and error-prone workflows into fast\, precise\, and reliable processes.\nIn this webinar\, you will learn how to: \n\nMechanically prepare micro targets using a mechanical cross-sectioning device (EM TXP)\, demonstrated live on a real sample\nProduce pristine surfaces through broad ion beam milling with the EM TIC 3X system\nPre-prepare your samples more efficiently\, reducing ion milling time through synergic use of the TXP-TIC 3X workflow\n\nPreparing micro targets in microelectronics and other advanced materials systems presents a major challenge because these targets are rarely visible. As a result\, pinpointing and aligning them precisely can be difficult\, making preparation to the exact target a time-consuming and error-prone process where the target may easily be missed. In addition\, specimens containing micro targets are typically small\, fragile\, and difficult to handle\, further complicating the workflow.\nAdvanced preparation systems now make it possible to achieve precise\, real-time control of micro target preparation and surface quality. The EM TXP device enables accurate in situ mechanical preparation through an integrated viewing system that enables every stage of the process to be monitored. When combined with the EM TIC 3X broad ion beam milling system\, you can produce pristine\, artifact-free surfaces ready for high-resolution EM analysis.\nDeveloped by Leica Microsystems\, this integrated workflow significantly simplifies the preparation of even the most challenging micro targets\, saving time while improving reliability and surface quality.\n \nRegistration  \nRegistration for attendees is free! Included in each registration is access to the expo\, technical presentations\, and a complimentary lunch!
URL:https://www.jhtechnologies.com/event/em-microtarget-preparation-webinar/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20251204T080000
DTEND;TZID=America/Los_Angeles:20251204T170000
DTSTAMP:20251211T195201Z
CREATED:20251014T230059Z
LAST-MODIFIED:20251211T195201Z
UID:13393-1764835200-1764867600@www.jhtechnologies.com
SUMMARY:SMTA Silicon Valley Expo & Tech Forum 2025
DESCRIPTION:December 4\, 2025 \nFremont Marriott Silicon Valley\, Fremont\, CA \nSMTA expos serve as a valuable platform for connecting industry professionals and exposing attendees to cutting-edge global technologies at the local level. Furthermore\, these regional events provide an important educational opportunity for local engineers who may be unable to attend the SMTA International conference. \nPlan now to join us for free technical sessions\, free lunch and the chance to network with leading suppliers to the electronics manufacturing industry! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/smta-silicon-valley-expo-tech-forum-2025/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20251105T080000
DTEND;TZID=America/Los_Angeles:20251105T170000
DTSTAMP:20251021T230909Z
CREATED:20251001T235000Z
LAST-MODIFIED:20251021T230909Z
UID:13255-1762329600-1762362000@www.jhtechnologies.com
SUMMARY:JH Technologies Open House – New England Showroom
DESCRIPTION:JH Technologies Open House – New England Showroom📅 Wednesday\, November 5\, 2025 | 🕘 9:00 AM – 5:00 PM📍 11 Trafalgar Square\, Suite 103\, Nashua\, NH 03063 \n\nYou’re invited to our New England Open House! \nJoin us in our Nashua showroom for a day of learning\, networking\, and live demonstrations. This special event will showcase new lab applications and include an exclusive remote demo on X-ray technology. \nEvent Highlights:\n➔ Remote X-ray Demo – Discover the latest innovations in imaging and analysis➔ Hands-On Product Demos – Explore new lab applications and solutions➔ Networking Opportunities – Connect with industry peers and JH Technologies experts➔ Complimentary Lunch – Enjoy a meal on us while you explore what’s new \nCome see how our advanced tools and expertise can support your work and help you stay ahead in your field. \n👉 Register today to secure your spot—space is limited!
URL:https://www.jhtechnologies.com/event/jh-technologies-open-house-new-england-showroom/
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