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X-WR-CALDESC:Events for JH Technologies
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260520T080000
DTEND;TZID=America/Los_Angeles:20260520T170000
DTSTAMP:20260429T201511Z
CREATED:20260429T201511Z
LAST-MODIFIED:20260429T201511Z
UID:14331-1779264000-1779296400@www.jhtechnologies.com
SUMMARY:Microscopy Society of Northeastern Ohio
DESCRIPTION:THE 68 TH ANNUAL MAY MEETING CONFERENCE\nWEDNESDAY  MAY 20\, 2026– DOLAN SCIENCE CENTER\, JOHN CARROLL UNIVERSITY\n  \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/microscopy-society-of-northeastern-ohio/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260528T090000
DTEND;TZID=America/Los_Angeles:20260528T180000
DTSTAMP:20260416T162618Z
CREATED:20260408T203918Z
LAST-MODIFIED:20260416T162618Z
UID:14152-1779958800-1779991200@www.jhtechnologies.com
SUMMARY:JH Technologies Fremont Open House
DESCRIPTION:Join us for an exciting\, hands-on Open House at JH Technologies in Fremont! This one-day event brings together cutting-edge microscopy\, metrology\, and imaging solutions—along with live demos\, expert talks\, and a chance to influence product development. \n \n📅 Date: Thursday\, May 28. 9AM – 6PM📍 Location: JH Technologies – 213 Hammond Avenue\, Fremont\, CA 94539🍽️ Perk: Free lunch provided \n🔬 What to Expect\n\nExpert Talk by CIQTEK\n\nLearn about EBSD (Electron Backscatter Diffraction)\nPresented by our in-house SEM application experts\n\n\nLive Demo from Xavis\n\nExplore the XScan product line in action\nSee real-time inspection capabilities\n\n\nInteractive Demo by Sensofar\n\nLive demo of the S lynx 2 system\nFirst look at newly released software features\n\n\n🚨Leica Product Beta Test Opportunity\n\nDigital imaging technology\, the new wave\nSee\, experience\, and get a chance to shape product development\n\n\n\n🎯 Why Attend?\n\nConnect with industry experts\nExperience live\, hands-on demonstrations\nDiscover the latest in microscopy and imaging technology\nNetwork with peers in your field\n\nREGISTER HERE
URL:https://www.jhtechnologies.com/event/jh-technologies-fremont-open-house/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260603T090000
DTEND;TZID=America/Los_Angeles:20260603T170000
DTSTAMP:20260414T171502Z
CREATED:20260225T211749Z
LAST-MODIFIED:20260414T171502Z
UID:13960-1780477200-1780506000@www.jhtechnologies.com
SUMMARY:Open House Nashua 2026
DESCRIPTION: 11 Trafalgar Square\, Suite 103\, Nashua\, NH 03063 \n\nYou’re invited to our New England Open House! \nJoin us in our Nashua showroom for a day of learning\, networking\, and live demonstrations. This special event will showcase new lab applications and include an exclusive remote demo on X-ray technology. \nEvent Highlights:\n➔ Remote X-ray Demo – Discover the latest innovations in imaging and analysis➔ Hands-On Product Demos – Explore new lab applications and solutions➔ Networking Opportunities – Connect with industry peers and JH Technologies experts➔ Complimentary Lunch – Enjoy a meal on us while you explore what’s new \nCome see how our advanced tools and expertise can support your work and help you stay ahead in your field. \n Register today to secure your spot—space is limited! \nREGISTER HERE!
URL:https://www.jhtechnologies.com/event/open-house-nashua-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260625T080000
DTEND;TZID=America/Los_Angeles:20260629T170000
DTSTAMP:20251219T002550Z
CREATED:20251219T002257Z
LAST-MODIFIED:20251219T002550Z
UID:13612-1782374400-1782752400@www.jhtechnologies.com
SUMMARY:Microscopy Society of Canada - IUMAS
DESCRIPTION:The MSC-SMC encourages networking and sharing of knowledge between scientists\, corporations\, students and retired members. PROMOTING MICROSCOPY SINCE 1972. \nSay Hi to our JH Team at the Ciqtek booth! \nREGISTER HERE!  \n 
URL:https://www.jhtechnologies.com/event/microscopy-society-of-canada-iumas/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260703T173000
DTEND;TZID=America/Los_Angeles:20260703T183000
DTSTAMP:20260710T185700Z
CREATED:20260710T185700Z
LAST-MODIFIED:20260710T185700Z
UID:15041-1783099800-1783103400@www.jhtechnologies.com
SUMMARY:M&M CIQTEK After Hours Technical Talk
DESCRIPTION:Unlocking High-Resolution Imaging with the CIQTEK HEM6000 FE-SEM\nDate\nMonday\, August 3\, 2026 \nTime\nAfter Exhibit Hall Hours (5:45 PM – 6:45 PM) \nLocation\nM&M – Booth #718 \nOverview\nJoin JH Technologies and CIQTEK for an exclusive after-hours technical presentation showcasing the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). \nThis presentation will demonstrate how high-resolution field emission SEM technology supports advanced materials characterization\, semiconductor inspection\, nanotechnology research\, and failure analysis. \nAttendees will gain valuable insights into imaging performance\, analytical capabilities\, and practical applications from microscopy experts. \nTopics Covered\n\nField Emission SEM Fundamentals\nHigh-Resolution Imaging\nSurface & Microstructure Analysis\nSemiconductor Applications\nMaterials Characterization\nFailure Analysis\nLive Questions & Discussion\n\nIdeal For\n\nSemiconductor Manufacturing\nResearch Laboratories\nUniversities\nMaterials Science\nNanotechnology\nElectronics\nFailure Analysis\nIndustrial R&D\n\nWhy Attend?\n\nLearn from microscopy experts\nExplore advanced FE-SEM capabilities\nSee real application examples\nNetwork with fellow researchers and engineers\nAsk technical questions during the discussion
URL:https://www.jhtechnologies.com/event/mm-ciqtek-after-hours-technical-talk/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260802T080000
DTEND;TZID=America/Los_Angeles:20260805T170000
DTSTAMP:20260429T202656Z
CREATED:20260429T202236Z
LAST-MODIFIED:20260429T202656Z
UID:14333-1785657600-1785949200@www.jhtechnologies.com
SUMMARY:M&M 2026
DESCRIPTION:M&M 2026 \nBaird Center | Milwaukee\, WI I August 2-6\, 2026 \n\n\n\n\n\nJoin us at the Baird Center in Milwaukee\, WI for M&M 2026. The world’s leading annual forum for the science and technology of microscopy and microanalysis.\n\n\nREGISTER HERE\n\n\n 
URL:https://www.jhtechnologies.com/event/14333/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260803T173000
DTEND;TZID=America/Los_Angeles:20260803T180000
DTSTAMP:20260723T204816Z
CREATED:20260723T204816Z
LAST-MODIFIED:20260723T204816Z
UID:15045-1785778200-1785780000@www.jhtechnologies.com
SUMMARY:M&M CIQTEK Vendor Tutorial: Unlocking the Power of High-Speed SEM
DESCRIPTION:Join JH Technologies and CIQTEK After Hours at M&M 2026\n📅 Monday\, August 3\, 2026🕔 5:45 PM – 6:45 PM📍 Baird Center | Milwaukee\, WI📌 M&M 2026 | Booth 718 \n\nAbout the Event\nJoin JH Technologies and CIQTEK after exhibit hall hours at the Microscopy & Microanalysis 2026 Conference for an evening technical presentation highlighting the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). \nThis technical presentation will explore how advanced\, high-speed scanning electron microscopy can deliver superb imaging resolution at low kV while supporting large-scale volume microscopy applications. \nDiscover how the CIQTEK HEM6000 is helping advance imaging and analysis in a range of demanding applications\, including: \n\n🔬 Materials characterization\n⚙️ Failure analysis\n💻 Semiconductor inspection\n🧪 Research and development\n🧬 Large-scale volume microscopy\n\nWhether you are exploring new microscopy technologies or looking to enhance your current imaging capabilities\, this presentation offers an opportunity to learn more about the performance and versatility of advanced FE-SEM technology. \nWe look forward to seeing you there!\n\nEvent Details\nEvent: CIQTEK Vendor TutorialTopic: Unlocking the Power of High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low KV for Large Scale Volume Microscopy Applications from CIQTEKDate: Monday\, August 3\, 2026Time: 5:45 PM – 6:45 PMLocation: Baird Center\, Milwaukee\, WIBooth: 718
URL:https://www.jhtechnologies.com/event/mm-ciqtek-vendor-tutorial-unlocking-the-power-of-high-speed-sem/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260804T103000
DTEND;TZID=America/Los_Angeles:20260805T170000
DTSTAMP:20260710T185144Z
CREATED:20260710T185144Z
LAST-MODIFIED:20260710T185144Z
UID:15038-1785839400-1785949200@www.jhtechnologies.com
SUMMARY:COXEM Lunch & Learn Low Vacuum SEM Imaging
DESCRIPTION:Date \n\nTuesday\, August 4\, 2026\nWednesday\, August 5\, 2026\n\nTime\n11:30 AM – 12:00 PM \nLocation\nCOXEM Booth\nM&M 2026 Exhibit Hall \nOverview\nJoin JH Technologies for a complimentary Lunch & Learn featuring the COXEM EM-40 Tabletop Scanning Electron Microscope. This 30-minute presentation will explore how low vacuum imaging enables fast\, efficient imaging of non-conductive and challenging samples with minimal preparation. \nPerfect for users in research\, manufacturing\, quality control\, education\, and failure analysis\, this session will provide practical insights into improving workflow efficiency while maintaining excellent imaging performance. \nIdeal For\n\nMaterials Science\nMetallurgy\nPolymers & Plastics\nGeology & Minerals\nPharmaceuticals\nFibers & Textiles\nEducation\nFailure Analysis\nQuality Assurance\n\n🍽️ Complimentary lunch will be provided to registered attendees while supplies last. \nReserve Your Seat \n[Register Now]
URL:https://www.jhtechnologies.com/event/coxem-lunch-learn-low-vacuum-sem-imaging/
ATTACH;FMTTYPE=image/png:https://www.jhtechnologies.com/wp-content/uploads/2026/07/9.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260901T100000
DTEND;TZID=America/Los_Angeles:20260901T103000
DTSTAMP:20260819T220236Z
CREATED:20260819T220236Z
LAST-MODIFIED:20260819T220236Z
UID:15084-1788256800-1788258600@www.jhtechnologies.com
SUMMARY:Join Sensofar Event 26
DESCRIPTION:Be among the first to discover what’s next in optical metrology—and stay tuned as JH Technologies prepares to bring new surface profiling capabilities to our Analytical Lab later this year. \n[Register for the Sensofar Event 26]\nRegister here: https://www.sensofar.com/metrology/webinars/sensofar-event-26/ \nAfter the announcement\, check back with JH Technologies for more information about our upcoming surface profiling system and how you may be able to experience the latest technology firsthand. \nWhat You’ll Discover\nIn one focused 20-minute session\, discover how Sensofar is moving surface measurement forward and what this evolution could mean for your daily metrology work. \nA new development in 3D optical metrology\nBe among the first to see the latest addition to Sensofar’s optical metrology portfolio. \nA more intuitive metrology experience\nDiscover how measurement workflows can become easier to operate\, understand\, and control.
URL:https://www.jhtechnologies.com/event/join-sensofar-event-26/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260914T080000
DTEND;TZID=America/Los_Angeles:20260919T170000
DTSTAMP:20260818T203502Z
CREATED:20260818T203413Z
LAST-MODIFIED:20260818T203502Z
UID:15070-1789372800-1789837200@www.jhtechnologies.com
SUMMARY:IMTS 2026
DESCRIPTION:Join JH Technologies at IMTS 2026 in Chicago to explore advanced microscopy\, metrology\, and inspection solutions for precision manufacturing and quality control. \nVisit our partners at their booths to see the latest technologies and learn how advanced imaging\, 3D optical profiling\, and measurement solutions can support your manufacturing applications. \nFeatured Exhibitors & Booths \n\nLeica Microsystems — Booth 134266\nMitutoyo — Booth 134117\nSensofar — Booth 134045\n\nStop by their booths to connect with our team and discover the latest solutions for surface measurement\, optical inspection\, and precision manufacturing.
URL:https://www.jhtechnologies.com/event/imts-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260923T080000
DTEND;TZID=America/Los_Angeles:20260923T170000
DTSTAMP:20260917T192502Z
CREATED:20260818T205143Z
LAST-MODIFIED:20260917T192502Z
UID:15075-1790150400-1790182800@www.jhtechnologies.com
SUMMARY:NW Electronics Design & Manufacturing Expo (NEDME) 2026
DESCRIPTION:Join JH Technologies at the NW Electronics Design & Manufacturing Expo (NEDME) in Portland for an exciting showcase of advanced microscopy\, inspection\, and analytical solutions for electronics and manufacturing applications. \nVisit JH Technologies at Booth 606 to explore our featured technologies from XAVIS\, Leica Microsystems\, and COXEM\, and connect with our team to discuss solutions for your inspection\, analysis\, and manufacturing needs. \nOur Open House Is Coming to NEDME!\nThis year\, we’re bringing our annual JH Technologies Open House directly to NEDME! Instead of hosting a separate event in Portland\, we’ll be bringing the Open House experience to our booth so you can meet our team\, explore our technologies\, and see what’s new—all in one place. \nREGISTER HERE \nWe look forward to seeing you at NEDME 2026\, Booth 606!
URL:https://www.jhtechnologies.com/event/nw-electronics-design-manufacturing-expo-nedme-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20261001
DTEND;VALUE=DATE:20261003
DTSTAMP:20260930T194335Z
CREATED:20260909T191625Z
LAST-MODIFIED:20260930T194335Z
UID:15242-1790812800-1790985599@www.jhtechnologies.com
SUMMARY:AReMS Annual Fall Meeting 2026
DESCRIPTION:2026 AReMS Annual Fall Meeting \nOctober 1–2\, 2026 \nJH Technologies is excited to participate in the 2026 Appalachian Regional Microscopy Society (AReMS) Annual Fall Meeting\, alongside our supplier CIQTEK. \nThis year\, JH Technologies will have its own booth\, giving attendees the opportunity to meet directly with our team and explore the microscopy\, imaging\, and materials characterization solutions we represent. \nCIQTEK will also be participating\, bringing its advanced electron microscopy solutions to the meeting. \nAReMS provides an opportunity for researchers\, students\, scientists\, and industry professionals to connect\, share technical knowledge\, and discuss the latest developments in microscopy and microanalysis. \nVisit JH Technologies to: \n\nMeet our team and discuss your microscopy needs\nLearn about our portfolio of microscopy and characterization solutions\nConnect with CIQTEK\nExplore solutions for materials science\, research\, and imaging applications\n\n📅 October 1–2\, 2026📍 2026 AReMS Annual Fall Meeting \nWe’d love to see you at the JH Technologies booth! \nLearn more about AReMS \n 
URL:https://www.jhtechnologies.com/event/arems-2026/
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END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20261004
DTEND;VALUE=DATE:20261009
DTSTAMP:20260909T192535Z
CREATED:20260909T192342Z
LAST-MODIFIED:20260909T192535Z
UID:15241-1791072000-1791503999@www.jhtechnologies.com
SUMMARY:ISTFA 2026
DESCRIPTION:ISTFA 2026 — International Symposium for Testing and Failure Analysis \nOctober 4–8\, 2026Henry B. González Convention Center | San Antonio\, Texas \nJH Technologies is excited to announce that our supplier\, CIQTEK\, will be participating in ISTFA 2026\, the 52nd International Symposium for Testing and Failure Analysis. \nISTFA brings together professionals from across the microelectronics failure analysis community to exchange knowledge\, explore emerging technologies\, and discuss techniques for testing\, characterization\, and failure analysis. \nCIQTEK’s electron microscopy solutions are designed to support demanding materials characterization and failure analysis workflows\, providing researchers and engineers with powerful imaging and analytical capabilities. \nVisit CIQTEK during ISTFA to learn more about their SEM solutions and discuss how advanced electron microscopy can support your failure analysis workflow. \n📍 Henry B. González Convention CenterSan Antonio\, TX📅 October 4–8\, 2026 \nLearn more about ISTFA 2026 \nISTFA’s 2026 technical program includes topics spanning microscopy\, package analysis\, defect localization\, nanoprobing\, sample preparation\, device analysis\, AI applications for failure analysis\, and materials characterization.
URL:https://www.jhtechnologies.com/event/istfa-2026-2/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261009T080000
DTEND;TZID=America/Los_Angeles:20261009T170000
DTSTAMP:20260909T194033Z
CREATED:20260909T194033Z
LAST-MODIFIED:20260909T194033Z
UID:15253-1791532800-1791565200@www.jhtechnologies.com
SUMMARY:2026 Great Lakes Microscopy Society Annual Meeting
DESCRIPTION:2026 Great Lakes Microscopy Society Annual Meeting \nOctober 9\, 2026Michigan Technological University | Houghton\, Michigan \nJH Technologies is pleased to announce that our supplier\, CIQTEK\, will be participating in the 2026 Great Lakes Microscopy Society (GLMS) Annual Meeting. \nThe GLMS Annual Meeting brings together researchers\, students\, scientists\, and microscopy professionals from across the Great Lakes region to share research\, explore new microscopy and microanalysis techniques\, and connect with colleagues across the field. \nCIQTEK will be on site to showcase its advanced electron microscopy solutions and discuss how modern SEM technology can support applications in materials science\, biological science\, microanalysis\, and research. \nWhether you’re working with challenging samples\, looking for higher-resolution imaging\, or exploring new microscopy capabilities\, this is a great opportunity to connect with the CIQTEK team and learn more about their technology. \nMeet CIQTEK at GLMS 2026 and discover what’s possible with advanced electron microscopy. \n📍 Michigan Technological University📅 October 9\, 2026 \nREGISTER HERE \nThe meeting covers microscopy\, microanalysis\, imaging\, and related research across materials science\, engineering\, biological sciences\, chemistry\, and more.
URL:https://www.jhtechnologies.com/event/2026-great-lakes-microscopy-society-annual-meeting/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261013T080000
DTEND;TZID=America/Los_Angeles:20261015T170000
DTSTAMP:20260429T202432Z
CREATED:20260429T202419Z
LAST-MODIFIED:20260429T202432Z
UID:14336-1791878400-1792083600@www.jhtechnologies.com
SUMMARY:SEMICON West 2026
DESCRIPTION:SEMICON West 2026\nOctober 13–15 | Moscone Center | San Francisco\, CA\nSEMICON West 2026 returns to San Francisco\, CA\, bringing together the world’s leading innovators\, engineers\, executives\, and decision-makers across the microelectronics supply chain. \nHosted at the iconic Moscone Center\, this flagship event is the ultimate platform to explore the technologies\, partnerships\, and strategies shaping the future of semiconductor manufacturing. \nBe part of the conversations\, technologies\, and partnerships that will define the next era of microelectronics. Join us October 13–15\, 2026!
URL:https://www.jhtechnologies.com/event/semicon-west/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261027T090000
DTEND;TZID=America/Los_Angeles:20261030T170000
DTSTAMP:20260902T203316Z
CREATED:20260819T221106Z
LAST-MODIFIED:20260902T203316Z
UID:15089-1793091600-1793379600@www.jhtechnologies.com
SUMMARY:Sample Prep Workshop Using Leica UC Enuity
DESCRIPTION:October 27–30\, 2026JH Technologies | 213 Hammond Ave.\, Fremont\, CA 94539 \nJoin JH Technologies and Leica for a hands-on workshop focused on best practices for TEM\, SEM\, and AFM sample preparation using the Leica UC Enuity Ultramicrotome. \nThis technical workshop will combine expert instruction\, demonstrations\, and hands-on sample preparation. Attendees will explore ultra-thin sectioning\, block-face preparation\, cryo-sectioning\, and failure analysis\, with opportunities to evaluate prepared samples using optical microscopy and SEM imaging. \nWorkshop Schedule\nTuesday\, October 27 – Thursday\, October 29 \n\n9:00 AM–12:00 PM\n1:00 PM–4:00 PM\n\nFriday\, October 30 \n\n9:00 AM–12:00 PM\n\nEach session will include approximately 30 minutes of technical instruction followed by demonstrations and hands-on activities. \nAttendance is limited to 5 participants per session. \nIndustry Experts\nHelmut GnaegiManaging Director of Diatome Diamond Knives and a renowned expert in ultramicrotomy and sectioning. \nSeth VillarrealLeica expert and workshop speaker specializing in Leica sample preparation technologies. \nLeica Enuity Ultramicrotome\nAttendees will have the opportunity to work with the Leica Enuity Ultramicrotome\, including its cryo-sectioning capability. JH Technologies will also provide optical microscopy and SEM capabilities for imaging and evaluating prepared samples. \nTopics We Will Cover\nTEM Sample PreparationLearn techniques for creating ultra-thin\, uniform sections suitable for Transmission Electron Microscopy. \nBlock-Face ImagingExplore trimming and preparation techniques for creating smooth\, flat surfaces for SEM\, AFM\, and optical microscopy. \nCryo-SectioningLearn how cryogenic sectioning can be used to prepare soft materials such as polymers\, coatings\, and elastomers. \nFailure AnalysisExplore sectioning techniques for multilayer materials and composites to evaluate adhesion\, layer thickness\, and internal structural defects. \nSample Preparation\nAttendees are welcome to bring or submit samples for sectioning during the workshop. \nPotential sample types include: \n\nPolymers\nPowders\nPaper\nSoft electronics\n\nWhy Ultramicrotomy?\nUltramicrotomy provides several advantages for materials characterization and sample preparation: \nReduced Thermal and Ion DamageUltramicrotomy does not rely on high-energy ion beams\, reducing the risk of ion-related contamination and heat-induced damage. \nLarge Sample AreasIt can produce relatively large\, homogeneous\, uniformly thin sections compared with localized FIB-prepared areas. \nSpeed and Cost EfficiencyOnce a sample is properly mounted or embedded\, multiple sequential sections can be produced efficiently. \nRegistration\nSpace is limited to max 5 participants per hands-on session. \n[REGISTER FOR THE WORKSHOP] \nFor questions about the workshop\, please contact JH Technologies. Sample requirements and shipping deadlines will be provided upon registration. \nFor questions about samples\, contact: \nMicah Harrelmharrel@jhtechnologies.com
URL:https://www.jhtechnologies.com/event/ultramicrotome-workshop-featuring-the-leica-enuity/
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261103T080000
DTEND;TZID=America/Los_Angeles:20261103T170000
DTSTAMP:20261028T174528Z
CREATED:20261028T174528Z
LAST-MODIFIED:20261028T174528Z
UID:15519-1793692800-1793725200@www.jhtechnologies.com
SUMMARY:IMRI-CIQTEK Lunch & Learn Seminar
DESCRIPTION:From Imaging Instrument to Integrated Characterization Platform: Future Directions in SEM\, FIB\, and Correlative Microscopy\nJoin us for an informative Lunch & Learn seminar featuring Luke Xin Ren\, Application Director at CIQTEK America\, as he explores the future of scanning electron microscopy (SEM)\, focused ion beam (FIB) technology\, and correlative microscopy. \nThis presentation will examine how microscopy is evolving beyond traditional imaging toward integrated characterization platforms that combine multiple analytical capabilities to provide a more comprehensive understanding of materials and samples. \nEvent Details\nDate: November 3\, 2026\nTime: 11:00 AM – 2:00 PM\nLocation: 2430 Engineering Hall \nSpeaker: Luke Xin Ren\nTitle: Application Director\, CIQTEK America \nWhat to Expect\nDuring this seminar\, attendees will learn about emerging directions in microscopy and characterization\, including: \n\nThe evolution of SEM from imaging tools to integrated characterization platforms\nAdvances in FIB technology and its role in materials analysis\nCorrelative microscopy and combining multiple imaging and analytical techniques\nFuture trends in microscopy instrumentation and workflow integration\nHow integrated characterization approaches can improve sample analysis and research capabilities\n\nWhether you work in materials science\, semiconductor research\, life sciences\, or other fields that rely on advanced microscopy\, this seminar offers an opportunity to learn about the latest developments and future possibilities in microscopy and characterization. \nJoin Us\nDon’t miss this opportunity to hear from CIQTEK’s application expert and learn how the next generation of microscopy technologies is shaping the future of scientific characterization. \nNovember 3 | 11:00 AM – 2:00 PM\n2430 Engineering Hall \nRegister today to reserve your spot.
URL:https://www.jhtechnologies.com/event/imri-ciqtek-lunch-learn-seminar/
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261105T100000
DTEND;TZID=America/Los_Angeles:20261105T150000
DTSTAMP:20260916T191746Z
CREATED:20260819T220800Z
LAST-MODIFIED:20260916T191746Z
UID:15087-1793872800-1793890800@www.jhtechnologies.com
SUMMARY:Workshop – Bruker eWarp EBSD in Fremont
DESCRIPTION:Join JH Technologies and Bruker for an upcoming workshop focused on Electron Backscatter Diffraction (EBSD) and its applications in materials characterization. \nLearn more about how EBSD can be used to analyze crystallographic orientation\, grain structure\, phase distribution\, and other microstructural features. This workshop will provide an opportunity to explore EBSD technology and gain insight into how it can support advanced materials research and analysis. \nDate : Nov 5\nLocation: 213 Hammond Ave\, Fremont\, CA\nTime : 10:00 AM – 3:00 PM (Pacific Time) \nLunch Included \nObjectives: \n\nUnderstand the principles and applications of EBSD.\nStep-by-step sample preparation for EBSD.\nRecognize the best SEM configurations and understand the advantages and limitations of EBSD detectors and data collection capabilities.\nAcquire and process EBSD datasets.\nInterpret and visualize EBSD results for microstructural analysis.\n\nA day filled with learning and networking. Whether you’re a beginner or an expert\, this workshop is perfect for anyone interested in EBSD technology. Don’t miss this opportunity to enhance your skills and connect with fellow enthusiasts. See you there! Space is limited— \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/learn-about-ebsd-at-our-upcoming-bruker-workshop/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261110T080000
DTEND;TZID=America/Los_Angeles:20261111T170000
DTSTAMP:20260910T210145Z
CREATED:20260429T203535Z
LAST-MODIFIED:20260910T210145Z
UID:14339-1794297600-1794416400@www.jhtechnologies.com
SUMMARY:AEMS 2026
DESCRIPTION:AEMS 2026 — Anaheim Electronics & Manufacturing Show\nNovember 10–11\, 2026Anaheim Convention Center | Anaheim\, CAJH Technologies — Booth 513 \nJoin JH Technologies at AEMS 2026\, the Anaheim Electronics & Manufacturing Show\, where we’ll showcase microscopy\, imaging\, metrology\, and inspection solutions for today’s advanced manufacturing and technology applications. \nVisit us at Booth 513 to explore solutions from leading manufacturers\, including Leica Microsystems\, Sensofar\, COXEM\, and more. \nExplore Solutions For\n\nElectronics & semiconductor applications\nManufacturing inspection\nMaterials characterization\nSurface measurement & 3D metrology\nFailure analysis\nMicroscopy & imaging\n\nWhether you’re looking for high-resolution imaging\, dimensional measurement\, surface characterization\, or inspection solutions\, our team is available to discuss your application and help identify the right technology for your needs. \nVisit JH Technologies at Booth 513\nNovember 10: 10:00 AM–5:00 PMNovember 11: 10:00 AM–2:00 PM \n📍 Anaheim Convention CenterAnaheim\, California \nStop by Booth 513 to see the technology up close and talk with our team. \nFeatured Manufacturers\nLeica Microsystems | Sensofar | COXEM | and more \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/aems-2026/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261129T080000
DTEND;TZID=America/Los_Angeles:20261204T170000
DTSTAMP:20260429T203839Z
CREATED:20260429T203839Z
LAST-MODIFIED:20260429T203839Z
UID:14343-1795939200-1796403600@www.jhtechnologies.com
SUMMARY:2026 MRS Fall Meeting & Exhibit
DESCRIPTION:2026 MRS Fall Meeting & Exhibit\nThe 2026 MRS Fall Meeting & Exhibit will take place November 29-December 5\, 2026 in Boston\, Massachusetts\, at the Hynes Convention Center and adjacent Sheraton Boston Hotel. \nNovember 29 – December 4\, 2026\nBoston\, Massachusetts\n\nAbstract Submission Opens May 2026
URL:https://www.jhtechnologies.com/event/2026-mrs-fall-meeting-exhibit/
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20261203T080000
DTEND;TZID=America/Los_Angeles:20261203T170000
DTSTAMP:20260429T203707Z
CREATED:20260429T203707Z
LAST-MODIFIED:20260429T203707Z
UID:14341-1796284800-1796317200@www.jhtechnologies.com
SUMMARY:SMTA Silicon Valley
DESCRIPTION:Plan now to join us for free technical sessions\, free lunch and the chance to network with leading suppliers to our industry! \nREGISTER HERE
URL:https://www.jhtechnologies.com/event/smta-silicon-valley/
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