Engineered to fit in standard microscope slide clips, the low profile of the X-Cite XP750 Objective Plane Power Sensor makes it ideal for use in the limited space between the objectives and stage on upright microscopes. On inverted microscopes, simply center the transmission light from above on the printed target to center the detection area over the objective lens. Working with dim ambient lighting? The backlit display on the X-Cite XR2100 Power Meter ensures that readings are always legible.

Calibrated for use at any wavelength between 320nm and 750nm, the X-Cite XP750 is compatible with a full range of filters. With sensitivity to power levels from 5μW to 500mW, it is appropriate for applications using both low and high-intensity illumination. This makes it suitable for use on standard, confocal, DSU and other microscope configurations.

Since the X-Cite XP750 measures light right on the stage, it can be used with any epi-fluorescence light source including HBO / mercury, metal halide or xenon lamps, lasers and LEDs. With hundreds of wavelength choices, the X-Cite XR2100 allows you to define ‘favorite wavelengths’ to correspond to your most frequently used sources and filters.

X-Cite XR2100 and X-Cite XP750 are calibrated according to a strict protocol using transfer standards traceable to NIST* and NRC**. For your

Consistency is essential for data integrity. By measuring and recording power output in absolute units (watts) with X-Cite, you ensure that illumination levels used in an experiment can always be repeated, no matter how light sources, light guides, filters, and other optical components change over time. This unique capability is critical for reducing post-experiment image processing time; making accurate, quantitative image comparisons; and compiling complete experiment documentation.