Electron Microscopy Sample Preparation


Preparing samples flawlessly is crucial for obtaining top-notch electron microscopy images. We understand the importance of meticulous EM sample preparation and offer preparation equipment
Ion Beam Milling and Target Surface Preparation

Ion beam milling is an advanced sample preparation technique that removes residual artifacts from mechanical cutting and polishing processes, ensuring a well-prepared sample surface quality. This non-destructive approach is essential for achieving high-resolution imaging and accurate microstructural analysis results. Ion beam milling is especially crucial for microstructural analysis applications such as:
- Energy Dispersive X-ray Spectroscopy (EDS)
- Electron Backscatter Diffraction (EBSD)
- Wavelength Dispersive Spectroscopy (WDS)
- Auger Electron Spectroscopy (AES)
Maximize Electron Microscopy Image Quality with Conductive Coatings
When it comes to capturing high-quality images using scanning electron microscopy (SEM), sample conductivity plays a crucial role. Non-conductive samples can lead to charging issues, resulting in poor image quality. To overcome this challenge, conductive coatings offer an effective solution, ensuring optimal imaging conditions and enhancing contrast.
If your sample lacks sufficient conductivity, sputter coating is a quick and efficient method to apply a thin, conductive layer. This technique involves depositing a conductive material, such as gold, platinum, or carbon, onto the sample’s surface, ensuring proper charge dissipation during electron microscopy imaging.

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