X-ray systems for Semiconductor

X-ray Systems for Electronics

X-Ray systems for large area applications

Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

X-Ray systems for Battery Technology

Full Size Field Emission SEM

Cold and Hot Sample Mounting

EM TXP Sample Targeting Systems

Forensic Comparison Microscopes

Fullsize Floor Standing SEM, Coxem CX-200K

Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P

Materials Compound Microscope Leica DM2700 M

Emspira Digital Microscope

Ergonomic Stereo Microscopes

Abrasive Cutters Large Area

Precision Cutters High Volume

Precision Cutters Low Volume

Hardness Testing Vickers/Knoop & Brinell

Hardness Testing Rockwell, Universal