Full-Size Tungsten Filament SEM | High Performance Imaging

The CIQTEK SEM3300 is a next-generation tungsten filament scanning electron microscope (SEM) designed for high-resolution imaging, precision surface analysis, and efficient material characterization.

Engineered for versatility and ease of use, the SEM3300 provides high-magnification imaging, automated adjustments, and a flexible system expansion platform—making it an ideal solution for materials science, industrial quality control, and semiconductor research.

Looking for a high-performance tungsten filament SEM? Request a custom quote today.

Key Features of the SEM3300 Tungsten Filament SEM

The CIQTEK SEM3300 combines advanced electron optics with automated operation, ensuring high-resolution imaging and easy sample handling for a wide range of applications.

High-Resolution Imaging – Achieves 2.5 nm resolution at 15 kV for precise nano-scale analysis.
Wide Accelerating Voltage Range (0.1 kV to 30 kV) – Enables both high-contrast and low-voltage imaging.
Powerful Magnification Capabilities – Supports magnification up to 300,000x for detailed surface observations.
5-Axis Motorized Stage – Vacuum-compatible stage ensures precise sample positioning and automated movement.
Integrated In-Lens & Everhart-Thornley Detectors – Provides enhanced signal collection for superior imaging contrast.
Optical Navigation System with Chamber Camera – Allows fast sample positioning and real-time monitoring.
Comprehensive Safety System – Includes anti-collision hardware and software for operator protection.
Pre-Aligned Filament Replacement Module – Simplifies maintenance and minimizes downtime.

Performance Advantages of the SEM3300 Tungsten Filament

The CIQTEK SEM3300 is engineered for high-resolution imaging, precise material characterization, and efficient operation, making it an ideal choice for researchers and industrial applications.

High-Performance Imaging – Provides low voltage imaging with field emission SEM-like resolution, ensuring clear, high-contrast imaging across a wide range of materials.
Advanced Electron Optics – Features a compound electrostatic and electromagnetic objective lens, minimizing distortions and improving image clarity.
Automated Workflow Optimization – Includes one-click autofocus, brightness, contrast, and astigmatism correction for effortless operation.
Versatile Sample Compatibility – Supports various materials, from semiconductors to polymers and metals, making it suitable for failure analysis and quality control.
Enhanced Sample Positioning & Accuracy – The 5-axis motorized vacuum-compatible stage ensures precise, repeatable specimen handling.
Multi-Detector System for Comprehensive Analysis – Integrated In-Lens and Everhart-Thornley Detectors improve signal detection and imaging contrast.
Automated operations (focus, brightness, contrast, astigmatism)
Safe & Efficient Operation – Equipped with anti-collision safety features and a pre-aligned tungsten filament replacement module for minimal downtime and easy maintenance.
Customizable for Research & Industrial Applications – Expandable with optional detectors, imaging software, and automation tools to fit specific workflow needs.

Interested in a high-resolution tungsten filament SEM? Get in touch to learn more.

Software Capabilities

The CIQTEK SEM3300 is equipped with a powerful software suite designed to enhance imaging, data analysis, and automation.

Particle & Pore Analysis Software – Provides advanced target detection and segmentation for deep material analysis.
Integrated Image Post-Processing Software – Includes enhanced contrast, noise reduction, and feature extraction tools.
Auto Measure Software (Optional) – Features multiple edge detection modes (Line, Space, Pitch) for precise measurements.
Software Development Kit (SDK) (Optional) – Offers custom microscope control interfaces for automated workflows.