Full-Size Tungsten Filament SEM | High Performance Imaging

The CIQTEK SEM3300 is a next-generation Tungsten Filament scanning electron microscope (SEM) designed for high-resolution imaging, precision surface analysis, and efficient material characterization.

Engineered for versatility and ease of use, the SEM3300 Tungsten SEM provides high-magnification imaging, automated adjustments, and a flexible system expansion platform—making it an ideal solution for materials science, industrial quality control, and semiconductor research.

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Key Features of the SEM3300 Tungsten Filament SEM

The CIQTEK SEM3300 combines advanced electron optics with automated operation, ensuring high-resolution imaging and easy sample handling for a wide range of applications.

High-Resolution Imaging

Achieves 2.5 nm resolution at 15 kV for precise nano-scale analysis.

Wide Accelerating Voltage Range (0.1 kV to 30 kV)

Enables both high-contrast and low-voltage imaging.

Powerful Magnification Capabilities

Supports magnification up to 300,000x for detailed surface observations.

5-Axis Motorized Stage

Vacuum-compatible stage ensures precise sample positioning and automated movement.

Integrated In-Lens & Everhart-Thornley Detectors

Provides enhanced signal collection for superior imaging contrast.

Optical Navigation System with Chamber Camera

Allows fast sample positioning and real-time monitoring.

Comprehensive Safety System

Includes anti-collision hardware and software for operator protection.

Pre-Aligned Filament Replacement Module

Simplifies maintenance and minimizes downtime.

Performance Advantages of the SEM3300 Tungsten Filament SEM

The CIQTEK SEM3300 Tungsten Filament SEM is engineered for high-resolution imaging, precise material characterization, and efficient operation, making it an ideal choice for researchers and industrial applications.

High-Resolution Imaging

Provides low voltage imaging with field emission SEM-like resolution, ensuring clear, high-contrast imaging across a wide range of materials.

Advanced Electron Optics

Features a compound electrostatic and electromagnetic objective lens, minimizing distortions and improving image clarity.

Automated Workflow Optimization

Includes one-click autofocus, brightness, contrast, and astigmatism correction for effortless operation.

Versatile Sample Compatibility

Supports various materials, from semiconductors to polymers and metals, making it suitable for failure analysis and quality control.

Enhanced Sample Positioning & Accuracy

The 5-axis motorized vacuum-compatible stage ensures precise, repeatable specimen handling.

Multi-Detector System for Comprehensive Analysis

Integrated In-Lens and Everhart-Thornley Detectors improve signal detection and imaging contrast.

Automated operations (focus, brightness, contrast, astigmatism)

Safe & Efficient Operation

Equipped with anti-collision safety features and a pre-aligned tungsten filament replacement module for minimal downtime and easy maintenance.

Customizable for Research & Industrial Applications

Expandable with optional detectors, imaging software, and automation tools to fit specific workflow needs.

Tungsten SEM Software Capabilities

The CIQTEK SEM3300 Tungsten SEM is equipped with a powerful software suite designed to enhance imaging, data analysis, and automation.

Particle & Pore Analysis Software – Provides advanced target detection and segmentation for deep material analysis.
Integrated Image Post-Processing Software – Includes enhanced contrast, noise reduction, and feature extraction tools.
Auto Measure Software (Optional) – Features multiple edge detection modes (Line, Space, Pitch) for precise measurements.
Software Development Kit (SDK) (Optional) – Offers custom microscope control interfaces for automated workflows.