Atomic Force Microscopy (AFM) Systems
Differentiating AFM Platforms by Application Requirements
CSI AFM systems are organized by measurement requirements and application complexity, allowing laboratories to select a configuration optimized for their research goals. From flexible flagship systems to upgrade solutions for existing microscopes, each platform is designed to deliver precision, stability, and long-term expandability.
Nano-Observer II Atomic Force Microscope
Advanced, Versatile AFM for Multidisciplinary Research
The Nano-Observer II is a high-performance Atomic Force Microscope designed for advanced nanoscale imaging and characterization across a wide range of materials and applications. Combining mechanical stability, low-noise electronics, and intuitive operation, it supports both experienced AFM users and new researchers.
- Materials Science
- Semiconductor Devices & Nanoelectronics
- Polymers and Soft Matter
- Energy and Battery Materials
- 2D Materials
- Biological Samples
Galaxy Dual Controller – AFM Upgrade Platform
Extend the Life and Capabilities of Existing AFM Systems
The Galaxy Dual Controller is a powerful upgrade solution that modernizes legacy AFM and STM platforms while unlocking advanced measurement modes previously unavailable on older systems. Compatible with Multimode, Pico SPM, and Agilent/Keysight AFMs (5100, 5500, 5600LS, and 54xx series), Galaxy Dual Controller delivers state-of-the-art performance without replacing the entire microscope.
- Reduces cost by extending the life of your current AFM
- Maintains existing AFM and STM modes
- Adds next-generation electrical and mechanical measurement capabilities
- Low-noise electronics and integrated lock-in detection
- Intuitive NanoSolution software with guided workflows
AFM Systems for Advanced Nanoscale Research
CSI Atomic Force Microscopy systems provide a scalable platform for nanoscale characterization—from routine imaging to advanced electrical and functional analysis. With modular hardware, future-ready software, and industry-leading AFM modes, CSI solutions support long-term research growth across academia and industry.
Advanced AFM Modes & Measurement Capabilities
CSI AFM systems support a comprehensive range of imaging and analytical modes, enabling precise nanoscale characterization across electrical, mechanical, magnetic, and thermal domains.
- Contact & Friction (LFM): Topography and lateral force mapping
- Resonant / Oscillating (AC): High-resolution imaging with reduced tip-sample interaction
- Soft Intermittent Contact (Soft-IC): Gentle imaging and quantitative measurements for soft or fragile samples
- Soft MEKA: High-resolution stiffness and adhesion mapping
- Force Modulation
- Nano-Indentation
- Force Spectroscopy
- Phase Imaging (AC Mechanical Contrast)
- HD-KFM™ III: High-definition surface potential and work function mapping
- Kelvin Force Microscopy (legacy)
- Electrostatic Force Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Variable Magnetic Field Imaging
