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April 2019 Newsletter IND

mitutoyo gdt metrology event banner

REGISTER TODAY FOR MITUTOYO'S GD&T METROLOGY AND MEASURLINK-SPC SEMINAR IN CITY OF INDUSTRY, CA

Ion Beam Milling System Promotion

Ion Beam Milling System Promotion

Purchase a Leica EM TIC3X Ion Beam Milling System with 2 stages and receive a Leica EM TXP Target Preparation Device basic unit at NO COST - valued at over $46,000!

targe preparation device
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Leica ic90

Leica ERGO Imaging Promotion

Purchase a qualifying Leica M60 or Leica M80Microscope System and receive a Leica IC90 E Camera and Leica Standalone kit at no additional cost!

Leica m60
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Our promise is to provide innovative optical and digital imaging systems, metallography equipment, sample preparation tools and metrology instruments from proven, reliable manufacturers with accurate and timely responses to your inquiries.

UPCOMING EVENTS

Join the microscopy experts from JH Technologies at these upcoming events:

  • May 1-2 Del Mar Electronics & Manufacturing Show
  • May 13-17 California Association of Criminalists - 133rd CAC Seminar
  • May 14-16 EASTEC
  • May 15 Mitutoyo GD&T Metrology and MeasurLink-SPC Educational Event
  • May 15-17 2019 GSA Cordilleran Section
  • May 15-16 BIOMEDevice East
  • May 16 SMTA Puget Sound Expo & Tech Forum
See All Upcoming Events
Job Shadowing

Job Shadowing

We recently held a job shadow day at our Fremont office supporting Cañada College, located in Redwood City, CA. Two Cañada students spent two days shadowing our applications and technical sales staff. They had an amazing experience!

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