Full-Size Scanning Electron Microscopes
Unlock the full potential of high-performance tabletop SEM capabilities with COXEM’s affordable and innovative solutions. Experience unparalleled image quality, cost-effectiveness, and user-friendly operation that will revolutionize your scientific exploration and analysis. Discover the COXEM advantage today and take your research to new heights.
Tungsten SEM’s
CIQTEK’s tungsten SEMs offer high-resolution imaging and elemental analysis at an affordable price. Ideal for materials science, electronics, and manufacturing, these reliable, user-friendly systems deliver precision and efficiency for routine analysis and quality control.
Field Emission Scanning Electron Microscopes (FESEM)
CIQTEK’s Field Emission SEMs offer ultra-high resolution and advanced imaging for nanoscale analysis. Designed for nanotechnology, semiconductors, and materials science, they deliver precise surface and elemental analysis with intuitive operation and cutting-edge performance.
Focused Ion Beam Scanning Electron Microscopes (FIB SEM)
CIQTEK’s Focused Ion Beam (FIB) SEMs integrate high-resolution imaging with ion beam precision for advanced nanoscale applications. These systems excel in tasks such as cross-sectional analysis, 3D tomography, and site-specific material modification, making them ideal for semiconductor development, materials research, and failure analysis. With seamless imaging, milling, and deposition capabilities, CIQTEK’s FIB SEMs provide researchers and engineers with versatile tools to tackle the most demanding challenges in nanotechnology and materials science.
Features
Compact User-Friendly Design, Affordable Cost of Ownership, High Performance Imaging and Analysis
- SEM microscope imaging and processing functions are integrated within an overall user interface, with comparative references displayed on the left and right.
Several Models are available including a larger chamber size on our compact floor standing model
