The EM-30N can acquire high vacuum Scanning Electron (SE) images of uncoated non-conductive polymers at beam energies of 1 to 3 kV.​

The EM-30 Plus series Desktop Scanning Electron Microscopes (SEM) are delivered with a 4 quadrant backscatter electron detector that can be operated in either COMPOSITION mode or TOPO mode. Composition mode is standard for atomic weight contrasted images, useful for both metrology measurements and for EDS.

BACKSCATTER ELECTRON DETECTOR (BSE)​

The BSE detector can be pivoted away from the SEM pole piece to a parking position and is also retractable without disconnection. This allows unobstructed access to shorter working distances using the SE detector and for other purposes.​

Capture images with surface and topographic details (SE) or Atomic Weight contrast (BSE)​

Combine both imaging detector signals for a composite image representing both Topography and Atomic Weight variation​

Learn More About SE & BSE

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