Join JH Technologies and our partner Sensofar for an exclusive webinar exploring cutting-edge solutions in semiconductor manufacturing metrology.
Date: Thursday, May 29
Time: CEST time 6 pm
Event Highlights
Unlock the Power of 3D Optical Metrology
Dive into the critical role of advanced metrology in solving today’s most challenging semiconductor inspection problems. Our expert-led webinar will showcase how innovative 3D measurement technologies are transforming semiconductor production.
Key Topics We’ll Cover
- Precision Process Control: Learn how 3D metrology improves manufacturing accuracy, reduces defects, and significantly enhances yield
- Automation in High-Volume Production: Discover strategies to streamline inspection processes, minimize manual errors, and accelerate decision-making
- Next-Generation Chip Solutions: Explore breakthrough approaches for advanced packaging and heterogeneous integration challenges
Why Attend?
- Gain insider insights from industry experts
- Understand the latest technological advancements
- Learn practical strategies to optimize semiconductor manufacturing processes
Register Now to Transform Your Semiconductor Inspection Approach!
REGISTER HERE
