October 27–30, 2026JH Technologies | 213 Hammond Ave., Fremont, CA 94539 Join JH Technologies and Leica for a hands-on workshop focused on best practices for TEM, SEM, and AFM sample preparation using the Leica UC Enuity Ultramicrotome. This technical workshop will combine expert instruction, demonstrations, and hands-on sample preparation. Attendees will explore ultra-thin sectioning, block-face […]
From Imaging Instrument to Integrated Characterization Platform: Future Directions in SEM, FIB, and Correlative Microscopy Join us for an informative Lunch & Learn seminar featuring Luke Xin Ren, Application Director at CIQTEK America, as he explores the future of scanning electron microscopy (SEM), focused ion beam (FIB) technology, and correlative microscopy. This presentation will examine […]
Join JH Technologies and Bruker for an upcoming workshop focused on Electron Backscatter Diffraction (EBSD) and its applications in materials characterization. Learn more about how EBSD can be used to analyze crystallographic orientation, grain structure, phase distribution, and other microstructural features. This workshop will provide an opportunity to explore EBSD technology and gain insight into […]
AEMS 2026 — Anaheim Electronics & Manufacturing Show November 10–11, 2026Anaheim Convention Center | Anaheim, CAJH Technologies — Booth 513 Join JH Technologies at AEMS 2026, the Anaheim Electronics & Manufacturing Show, where we’ll showcase microscopy, imaging, metrology, and inspection solutions for today’s advanced manufacturing and technology applications. Visit us at Booth 513 to explore […]
2026 MRS Fall Meeting & Exhibit The 2026 MRS Fall Meeting & Exhibit will take place November 29-December 5, 2026 in Boston, Massachusetts, at the Hynes Convention Center and adjacent Sheraton Boston Hotel. November 29 - December 4, 2026 Boston, Massachusetts Abstract Submission Opens May 2026
Plan now to join us for free technical sessions, free lunch and the chance to network with leading suppliers to our industry! REGISTER HERE
