Share your experiences and stories of chasing the ever-smaller and more elusive defects at the 48th International Symposium for Testing and Failure Analysis, the premier event for the microelectronics failure analysis community. We invite you to submit your work for publication and to present to the industry in Pasadena, California, at the 48th year of ISTFA.
See our partner Leica Microsystems at Booth 423
Optical and Digital Microscopes, Inspection systems, and Meterology
10/30/2022 - 11/03/2022
Pasadena Convention Center