X-Ray Systems

X-Ray Inspection & Analysis Advanced X-ray inspection solutions for non-destructive testing (NDT) in industries like aerospace, automotive, and electronics. These systems deliver high-quality imaging for defect detection, structural integrity assessment, […]

SEM’s: Tabletop & Compact Floor Standing

Unlock the full potential of high-performance tabletop SEM capabilities with COXEM’s affordable and innovative solutions. Experience unparalleled image quality, cost-effectiveness, and user-friendly operation that will revolutionize your scientific exploration and analysis. Discover the COXEM advantage today and take your research to new heights.

Full-Size Scanning Electron Microscopes

Ciqtek

Unlock the full potential of high-performance tabletop SEM capabilities with COXEM’s affordable and innovative solutions. Experience unparalleled image quality, cost-effectiveness, and user-friendly operation that will revolutionize your scientific exploration and analysis. Discover the COXEM advantage today and take your research to new heights.

Solutions for Semiconductor Applications

Recent Blogs Solutions for Semiconductor Applications JH Technologies is pleased to provide sales, marketing, and service for Sensofar’s advanced microelectronics and semiconductor charachterization instruments. Sensofar has developed a number of […]

New S lynx 2 Optical Surface Profiler

Recent Blogs New S lynx 2 Optical Surface Profiler A NEW GAME CHANGING SURFACE PROFILER Cost effective, Compact, with Advance Features S lynx 2 – Powerful, Compact 3D Optical Profiler […]

Accessories and Lenses

Complementing our comprehensive instrument offerings, we provide a diverse range of accessories to enhance your workflow and capabilities.

JH Analytical Services

Our analytical laboratory provides specialized testing and characterization services across multiple industries.

Metrology and 3D Surface Profiling

In the realms of scientific research, industrial inspection, and quality control, accurate metrology and 3D surface profiling are essential for ensuring precise measurements and comprehensive analysis.