Tariff Policy Simplified: Stability, Transparency, and Trust
Recent Blogs JHT Tariff Policy: Stability, Transparency, and Trust Stability, Transparency, and Trust: Our Promise to You in Uncertain Times At JH Technologies, our commitment has always gone beyond providing […]
Demonstration Equipment: Beating The Tariff Trap
Recent Blogs Demonstration Equipment: Beating the Tariff trap In a world where global trade dynamics shift overnight and tariff regulations seem to change with the wind, businesses, universities, and public […]
The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery
Recent Blogs The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery At JH Technologies, we’re no strangers to solving tough problems. But nothing could’ve […]
What is the best method to prepare a sample for EBSD? [Application Note]
Recent Blogs What is the best method to prepare a sample for EBSD? [Application Note] Although EBSD (Electron Backscatter Diffraction) as a technique to study the crystalline structure of materials […]
Memory Device Cross-Sectioning [Learn from the JHA Team]
Recent Blogs Memory Device Cross-Sectioning [Learn from the JHA Team] Producing Memory Device Cross-Sectiong Samples Our newest JH Analytical Team member David is supporting and learning all of the functions […]
Bruker EDS & EBSD
Recent Blogs EDS & EBSD for SEM Adding Bruker EDS to your SEM turns it into a powerful analytical tool allowing a multitude of capabilities using advanced microanalysis features for elemental analysis. […]
Coxem CP-8000
Recent Blogs Coxem CP-8000+ The CP-8000+ is an advanced sample preparation tool that etches a cross section of a sample using an argon ion beam. This process avoids physical deformation […]
JH Technologies Partners With Evactron
Recent Blogs JH Technologies Partners with Evactron We are proud to announce our partnership with Evactron the leader in high-performance plasma cleaning systems, helping to produce the best SEM images […]
Student Friendly Scanning Electron Microscopes
Recent Blogs Student Friendly Scanning Electron Microscopes For many manufacturers and researchers scanning electron microscopes have proved to be a valuable assest for their analysis needs. Today SEM’s are more […]
Overcoming Challenges of Imaging Non-Conductive Samples in Electron Microscopy
Recent Blogs Overcoming Challenges of Imaging Non-Conductive Samples in Electron Microscopy [SEM Technical Note] In standard high-vacuum electron microscopy, accurate imaging of non-conductive materials poses difficulties due to charge accumulation […]