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Coxem CX-200Plus

Full-size SEM

A full-size floor model Scanning Electron Microscope (SEM) that both new and experienced users will find suitable for any type of demanding research and quality control requirements. The standard supplied configuration of the CX-200plus includes both SE and BSE imaging detectors and an internal chamber view camera for easy stage tilt and height adjustments.

Offers high-resolution imaging capabilities at a very attractive price. After evaluating the CX-200plus, your search for the most cost-effective solution will be an easy decision.

The CX-200plus is available from many analytical options for EDS and WDS elemental micro-analysis; EBSD micro-structure crystalline analysis; and CL (cathodoluminescence) internal structure analysis. Automated analysis capabilities for features and particles are available through our EDS partners.​
 
The CX-200plus provides a unique “Panorama” mode that allows the SEM to collect high-resolution images of large samples by controlling the motorized stage at higher magnification and automatically collecting large images from several thousand filed images. This capability is very useful for applications such as detailed examination or metrology of semiconductors and electronic assemblies and for producing images that can be printed in poster or wall sizes with high definition.​

 

  • NanoStation

Experience upgraded functions and new features with the new NanoStation 4.0 Gui such as MiniMap, Panorama Shot, Chamber Scope, Signal Mixing and etc. NanoStation 4.0 provides two different modes for operation: ‘EASY’ and ‘EXPERT’. User can choose their own optimized mode based on experience and proficiency. EASY mode consists of most frequently used functions and upgraded auto functions that allow the entry-level user to operate the SEM in a simplified manner. EXPERT mode includes all functions and allows
the advanced user to adjust more parameters in order to obtain the best results

  • Panorama Shot 

Panorama Shot function in NanoStation 4.0 can combine hundreds or thousands of SEM images side by side into one consolidated image through a stitching function. This function enables the user to capture high-resolution images of large areas

  • STEM

COXEM offers an annular STEM detector. BF mode and
DF mode can be selected. 4 TEM grid specimens can be
loaded at once. Precise EDS analysis is possible at the
same time without further adjustment

  • Dual Display / Signal Mixing

Dual Display Mode
SE and BSE images can be observed in dual display at the same time.
Signal Mixing Mode
By merging SE and BSE images, the advantages of both images can be observed at simultaneously in a
composite image

 

CX-200Plus

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