Leica EM TXP Target Preparation for Electron Microscopy

A versatile target preparation device for microscopy. Combining milling, sawing, grinding, and polishing capabilities with an integrated stereomicroscope, makes the EM TXP an efficient tool for preparing samples for SEM, TEM, and LM examinations.

Features

The system’s innovative features enhance precision and streamline the sample preparation workflow
Multi-functional preparation capabilities:
- Milling, sawing, grinding, and polishing
- Various tool inserts for different techniques
Integrated stereomicroscope:
- Allows direct observation of barely visible targets
- Enables distance determination with eyepiece graticule
Adjustable specimen pivot arm:
- Observation angles between 0° and 60°, or 90° to the front face
Automated process control:
- E-W guiding mechanism
- Force-regulated feed control
- Countdown function

Benefits

Enhanced Precision: Direct sample observation for faster, more accurate targeting.
Improved Efficiency: Eliminates sample transfers, speeding up preparation.
Versatility: Multiple preparation methods in one instrument.
Cost-effective: Saves time and reduces reliance on multiple tools.
Workflow Optimization: Streamlined quality control with Leica system integration.
User-friendly: Automation minimizes manual intervention.