Full-Size Field Emission SEM (FE-SEM) | High-Resolution Imaging
The CIQTEK SEM5000X is an high performance Field Emission Scanning Electron Microscope (FE-SEM) designed for nano-structural materials research and semiconductor development and engineered for stability, precision, and high-contrast imaging.
Looking for field emission scanning electron microscope prices? Request a custom quote today.
Key Features of the SEM5000X FE-SEM
- Ultra-High Resolution Imaging – Achieves 0.6 nm resolution at 15kV for precise nano-scale imaging.
- Low-Voltage Imaging Without Coating – Preserves sample integrity while delivering high-contrast visualization.
- Comprehensive Material Characterization – Equipped with multiple detectors (in-lens, ETD, BSED, STEM) for diverse imaging applications.
- High Stability & Reduced Sample Prep Time – The dual-beam deceleration mode enhances low-voltage imaging, reducing drift and minimizing sample preparation time.
- Breakthrough resolving power
- Mechanical eucentric specimen stage means the stage can be tilted or rotated while maintaining the same focal point
- Specimen exchange load-lock (8 inch compatible)
- Looking for a field emission scanning electron microscope price? Request a custom quote today.
Performance Advantages of the SEM5000X FE-SEM
The SEM5000X FE-SEM offers superior imaging capabilities for materials science, semiconductor fabrication, and nanotechnology research:
- Versatile Imaging Capabilities – Supports materials science, semiconductors, and nanotechnology
- Low-voltage Imaging Without Coating – reserves sample integrity while delivering high-contrast imaging
- Comprehensive Material Characterization – Multiple detector options ensure detailed structural analysis
- Supports a Wide Range of Samples – Compatible with polymers, ceramics, and biological specimens
- Accelerated Research & Development – Reduces sample preparation time with dual deceleration and low-voltage imaging
- Flexible Imaging Modes – Offers bright-field, dark-field, and Z-contrast imaging for enhanced visualization
- Expandable Research Platform – Adaptable for emerging industrial and scientific applications
Interested in comparing Field Emission SEM pricing and configurations? Contact us today for a tailored quote.
Software and Automation Options for Enhanced Analysis
The SEM5000X offers optional software packages to streamline imaging, enhance data accuracy, and optimize research workflows:
- Particle & Pore Analysis Software – Advanced target detection and segmentation
- Integrated Image Processing – Post-processing tools for enhanced contrast and feature extraction
- Auto Measure Software – Multiple edge detection modes (Line, Space, Pitch)
- Software Development Kit – Complete microscope control for custom workflows
With intelligent automation and measurement tools, the SEM5000X accelerates data acquisition and analysis, improving productivity and reproducibility in research and industrial environments.
