Full Size Tungsten SEM
The CIQTEK SEM3300 is a next-generation tungsten filament scanning electron microscope that combines in-lens electron detectors with electrostatic and electromagnetic compound objective lenses, enabling low-voltage analysis previously only available in field emission SEMs.
Full Size SEM Features
- Resolution of 2.5 nm @ 15 kV
- Accelerating voltage range of 0.1 kV to 30 kV
- Magnification up to 300,000x
- 5-axis vacuum compatible motorized stage
- In-lens electron detector and Everhart-Thornley detector
- Optical navigation system with chamber camera
- Comprehensive safety features with multiple anti-collision systems
- Pre-aligned filament replacement module
Full Size SEM Benefits
- Achieves field emission SEM-level analysis at lower voltages
- Enhanced sample imaging and positioning accuracy
- Automated operations (focus, brightness, contrast, astigmatism)
- Flexible system expansion options with multiple detector choices
- Anti-collision hardware and software for safe operation
- Easy maintenance with simplified filament replacement
- Versatile analysis capabilities using optional software packages
- Comprehensive imaging and measurement capabilities
- Intuitive navigation and control interface
- Efficient workflow incorporating one-click imaging capability
Software Capabilities
Particle & Pore Analysis Software
- Target detection and segmentation algorithms
Image Post-processing Software:
- Integrated EM image processing functions
Auto Measure Software (Optional):
- Multiple edge detection modes (Line, Space, Pitch)
Software Development Kit (Optional):
- Complete microscope control interfaces
