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Leica EM TXP

The Leica EM TXP is a target preparation device for millingsawinggrinding, and polishing samples prior to examination by SEMTEM, and LM techniques.

An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.

With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule

Integrated automatic process control

Integrated process control with automatic E-W guiding mechanism, force-regulated feed control and countdown function saves the user from time-consuming routine sample preparation

Surface finish and target examination

Surface finish and target examination with the integrated stereomicroscope means that the user does not have to transfer the sample for distance estimation and surface evaluation, which increases user efficiency

Variety of tool inserts

A variety of tool inserts allows the specimen to be milled, sawed, drilled, ground, and polished without sample removal from the instrument. The ability to observe the process through the stereomicroscope results in time and cost savings

Inspection of Multilayer Samples

Workflow in Quality Control: Combining the target surfacing system Leica EM TXP and the light microscope Leica DM2700 M allows for it to reduce the required procedure, streamlines the workflow, and produce reliable and precise results

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