Sensofar S neox Automated Surface Profiling
Sensofar 3D surface profiling solutions enable precise measurements and comprehensive analysis, essential for scientific research, industrial inspection, and quality control in fields such as semiconductors, optics, and advanced materials
S neox Features
- 4-in 1 technologies in one instrument including confocal, interferometry, AI focus variation, thin-film
- Automated with the fast data acquisition
- Complete surface characterization, analysis, and reporting
- Designed for quality assurance, failure analysis, and R&D
- Surface texture parameters based on ISO standards
- Optional 5-Axis movement for round or cylindrical samples
S neox Benefits
- High-resolution mapping of surface features down to the nano-scale
- 4 technologies provide accurate data from any rough, semi-rough, glass like, or highly-reflective surfaces
- Lateral resolution 0.15um with spatial sampling down to 0.01um
- Motorized tip-tilt allows for fast automatic leveling, reducing sample prep time
- Max sample size 300mm(L) x 300mm(W) x 350mm(H)
- 5-axis enables automatic 3D measurements at defined positions to create 3D volumetric profiling
