Leica Promotions

Receive a significant discount on EM GP2

Promotions/Leica/purchase-pre-configured-dm-ilm-significant-discount

25% Off Overstock Sale on Leica DM500 educational Microscopes

Get up to $600 trade-in credit for your old, tired or broken stereo microscope when you purchase Leica A60S/F Stereozoom Rework Package or Inspection Package

Upgrade your existing Leica UC7 system to ARTOS and receive $25,000 discount

The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM examination

Receive upto $50,000 in trade for existing High Pressure freezer

Leica Map with the highly intuitive desktop publishing environment, it is the perfect solution for measuring industrial surfaces in laboratories, production facilities and research.

The trade-in promotion allows you to upgrade to a new Leica microscope with the trade-in of your old comparable compound microscope. Get some value for your old instrument and replace it with a modern product with more capability and flexibility.

List of Inspection & Rework Microscope packages at a significant discount

The modular Leica FS C motorized comparison macroscope is used for a wide range of forensic investigations including ballistics, toolmark, and document comparison.

The modular Leica FS C motorized comparison macroscope is used for a wide range of forensic investigations including ballistics, toolmark, and document comparison. Intelligent Automation combines with outstanding ergonomic design. The five apochromatically-corrected macro objectives feature a high numerical aperture and built-in, adjustable iris diaphragms for top optical performance.

Purchase two EZ4 microscopes or two DM series Microscope(DM500, DM750, or DM750P) with two ICC50 cameras (ICC50E or ICC50W) and receive a license to the AirTeach Software package for free.

Purchase a qualifying M60 or M80 microscope system and receive a Leica IC90E Camera and Leica standalone kit for free

The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy(SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.

Leica Microsystems offers its customers a digital classroom: Easy to use, fast live images, brilliant results – microscope users achieve all of this and more with the new Leica ICC50 W and Leica ICC50 E cameras. Leica Microsystems gets right to the heart of today's requirements for innovative image management and expands its extensive high-definition product range.