Tariff Policy Simplified: Stability, Transparency, and Trust
Recent Blogs JHT Tariff Policy: Stability, Transparency, and Trust Stability, Transparency, and Trust: Our Promise to You in Uncertain Times At JH Technologies, our commitment has always gone beyond providing […]
Demonstration Equipment: Beating The Tariff Trap
Recent Blogs Demonstration Equipment: Beating the Tariff trap In a world where global trade dynamics shift overnight and tariff regulations seem to change with the wind, businesses, universities, and public […]
The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery
Recent Blogs The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery At JH Technologies, we’re no strangers to solving tough problems. But nothing could’ve […]
What is the best method to prepare a sample for EBSD? [Application Note]
Recent Blogs What is the best method to prepare a sample for EBSD? [Application Note] Although EBSD (Electron Backscatter Diffraction) as a technique to study the crystalline structure of materials […]
Memory Device Cross-Sectioning [Learn from the JHA Team]
Recent Blogs Memory Device Cross-Sectioning [Learn from the JHA Team] Producing Memory Device Cross-Sectiong Samples Our newest JH Analytical Team member David is supporting and learning all of the functions […]
Bruker EDS & EBSD
Recent Blogs EDS & EBSD for SEM Adding Bruker EDS to your SEM turns it into a powerful analytical tool allowing a multitude of capabilities using advanced microanalysis features for elemental analysis. […]
Coxem CP-8000
Recent Blogs Coxem CP-8000+ The CP-8000+ is an advanced sample preparation tool that etches a cross section of a sample using an argon ion beam. This process avoids physical deformation […]
JH Technologies Partners With Evactron
Recent Blogs JH Technologies Partners with Evactron We are proud to announce our partnership with Evactron the leader in high-performance plasma cleaning systems, helping to produce the best SEM images […]
Student Friendly Scanning Electron Microscopes
Recent Blogs Student Friendly Scanning Electron Microscopes Scanning electron microscopes (SEMs) have long been essential tools for manufacturers and researchers who need to understand materials at the micro- and nanoscale. […]
Overcoming Challenges of Imaging Non-Conductive Samples in Electron Microscopy
Recent Blogs Overcoming Challenges of Imaging Non-Conductive Samples in Electron Microscopy [SEM Technical Note] In standard high-vacuum electron microscopy, accurate imaging of non-conductive materials poses difficulties due to charge accumulation […]