Join JH Technologies and CIQTEK After Hours at M&M 2026

📅 Monday, August 3, 2026
🕔 5:45 PM – 6:45 PM
📍 Baird Center | Milwaukee, WI
📌 M&M 2026 | Booth 718

About the Event

Join JH Technologies and CIQTEK after exhibit hall hours at the Microscopy & Microanalysis 2026 Conference for an evening technical presentation highlighting the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM).

This technical presentation will explore how advanced, high-speed scanning electron microscopy can deliver superb imaging resolution at low kV while supporting large-scale volume microscopy applications.

Discover how the CIQTEK HEM6000 is helping advance imaging and analysis in a range of demanding applications, including:

• 🔬 Materials characterization
• ⚙️ Failure analysis
• 💻 Semiconductor inspection
• 🧪 Research and development
• 🧬 Large-scale volume microscopy

Whether you are exploring new microscopy technologies or looking to enhance your current imaging capabilities, this presentation offers an opportunity to learn more about the performance and versatility of advanced FE-SEM technology.

We look forward to seeing you there!

Event Details

Event: CIQTEK Vendor Tutorial
Topic: Unlocking the Power of High-Speed Scanning Electron Microscopy with No Compromise of Superb Imaging Resolution at Low KV for Large Scale Volume Microscopy Applications from CIQTEK
Date: Monday, August 3, 2026
Time: 5:45 PM – 6:45 PM
Location: Baird Center, Milwaukee, WI
Booth: 718