October 27–30, 2026
JH Technologies | 213 Hammond Ave., Fremont, CA 94539

Join JH Technologies and Leica for a hands-on workshop focused on best practices for TEM, SEM, and AFM sample preparation using the Leica UC Enuity Ultramicrotome.

This technical workshop will combine expert instruction, demonstrations, and hands-on sample preparation. Attendees will explore ultra-thin sectioning, block-face preparation, cryo-sectioning, and failure analysis, with opportunities to evaluate prepared samples using optical microscopy and SEM imaging.

Workshop Schedule

Tuesday, October 27 – Thursday, October 29

• 9:00 AM–12:00 PM
• 1:00 PM–4:00 PM

Friday, October 30

• 9:00 AM–12:00 PM

Each session will include approximately 30 minutes of technical instruction followed by demonstrations and hands-on activities.

Attendance is limited to 5 participants per session.

Industry Experts

Helmut Gnaegi
Managing Director of Diatome Diamond Knives and a renowned expert in ultramicrotomy and sectioning.

Seth Villarreal
Leica expert and workshop speaker specializing in Leica sample preparation technologies.

Leica Enuity Ultramicrotome

Attendees will have the opportunity to work with the Leica Enuity Ultramicrotome, including its cryo-sectioning capability. JH Technologies will also provide optical microscopy and SEM capabilities for imaging and evaluating prepared samples.

Topics We Will Cover

TEM Sample Preparation
Learn techniques for creating ultra-thin, uniform sections suitable for Transmission Electron Microscopy.

Block-Face Imaging
Explore trimming and preparation techniques for creating smooth, flat surfaces for SEM, AFM, and optical microscopy.

Cryo-Sectioning
Learn how cryogenic sectioning can be used to prepare soft materials such as polymers, coatings, and elastomers.

Failure Analysis
Explore sectioning techniques for multilayer materials and composites to evaluate adhesion, layer thickness, and internal structural defects.

Sample Preparation

Attendees are welcome to bring or submit samples for sectioning during the workshop.

Potential sample types include:

• Polymers
• Powders
• Paper
• Soft electronics

Why Ultramicrotomy?

Ultramicrotomy provides several advantages for materials characterization and sample preparation:

Reduced Thermal and Ion Damage
Ultramicrotomy does not rely on high-energy ion beams, reducing the risk of ion-related contamination and heat-induced damage.

Large Sample Areas
It can produce relatively large, homogeneous, uniformly thin sections compared with localized FIB-prepared areas.

Speed and Cost Efficiency
Once a sample is properly mounted or embedded, multiple sequential sections can be produced efficiently.

Registration

Space is limited to max 5 participants per hands-on session.

[REGISTER FOR THE WORKSHOP]

For questions about the workshop, please contact JH Technologies. Sample requirements and shipping deadlines will be provided upon registration.

For questions about samples, contact:

Micah Harrel
mharrel@jhtechnologies.com