From Imaging Instrument to Integrated Characterization Platform: Future Directions in SEM, FIB, and Correlative Microscopy

Join us for an informative Lunch & Learn seminar featuring Luke Xin Ren, Application Director at CIQTEK America, as he explores the future of scanning electron microscopy (SEM), focused ion beam (FIB) technology, and correlative microscopy.

This presentation will examine how microscopy is evolving beyond traditional imaging toward integrated characterization platforms that combine multiple analytical capabilities to provide a more comprehensive understanding of materials and samples.

Event Details

Date: November 3, 2026
Time: 11:00 AM – 2:00 PM
Location: 2430 Engineering Hall

Speaker: Luke Xin Ren
Title: Application Director, CIQTEK America

What to Expect

During this seminar, attendees will learn about emerging directions in microscopy and characterization, including:

• The evolution of SEM from imaging tools to integrated characterization platforms
• Advances in FIB technology and its role in materials analysis
• Correlative microscopy and combining multiple imaging and analytical techniques
• Future trends in microscopy instrumentation and workflow integration
• How integrated characterization approaches can improve sample analysis and research capabilities

Whether you work in materials science, semiconductor research, life sciences, or other fields that rely on advanced microscopy, this seminar offers an opportunity to learn about the latest developments and future possibilities in microscopy and characterization.

Join Us

Don’t miss this opportunity to hear from CIQTEK’s application expert and learn how the next generation of microscopy technologies is shaping the future of scientific characterization.

November 3 | 11:00 AM – 2:00 PM
2430 Engineering Hall

Register today to reserve your spot.