ISTFA 2026
ISTFA 2026 — International Symposium for Testing and Failure Analysis
October 4–8, 2026
Henry B. González Convention Center | San Antonio, Texas
JH Technologies is excited to announce that our supplier, CIQTEK, will be participating in ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis.
ISTFA brings together professionals from across the microelectronics failure analysis community to exchange knowledge, explore emerging technologies, and discuss techniques for testing, characterization, and failure analysis.
CIQTEK’s electron microscopy solutions are designed to support demanding materials characterization and failure analysis workflows, providing researchers and engineers with powerful imaging and analytical capabilities.
Visit CIQTEK during ISTFA to learn more about their SEM solutions and discuss how advanced electron microscopy can support your failure analysis workflow.
📍 Henry B. González Convention Center
San Antonio, TX
📅 October 4–8, 2026
ISTFA’s 2026 technical program includes topics spanning microscopy, package analysis, defect localization, nanoprobing, sample preparation, device analysis, AI applications for failure analysis, and materials characterization.