Unlocking High-Resolution Imaging with the CIQTEK HEM6000 FE-SEM

Date
Monday, August 3, 2026

Time
After Exhibit Hall Hours (5:45 PM – 6:45 PM)

Location
M&M – Booth #718

Overview

Join JH Technologies and CIQTEK for an exclusive after-hours technical presentation showcasing the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM).

This presentation will demonstrate how high-resolution field emission SEM technology supports advanced materials characterization, semiconductor inspection, nanotechnology research, and failure analysis.

Attendees will gain valuable insights into imaging performance, analytical capabilities, and practical applications from microscopy experts.

Topics Covered

• Field Emission SEM Fundamentals
• High-Resolution Imaging
• Surface & Microstructure Analysis
• Semiconductor Applications
• Materials Characterization
• Failure Analysis
• Live Questions & Discussion

Ideal For

• Semiconductor Manufacturing
• Research Laboratories
• Universities
• Materials Science
• Nanotechnology
• Electronics
• Failure Analysis
• Industrial R&D

Why Attend?

• Learn from microscopy experts
• Explore advanced FE-SEM capabilities
• See real application examples
• Network with fellow researchers and engineers
• Ask technical questions during the discussion