Join JH Technologies at the NW Electronics Design & Manufacturing Expo (NEDME) in Portland for an exciting showcase of advanced microscopy, inspection, and analytical solutions for electronics and manufacturing applications. Visit JH Technologies at Booth 606 to explore our featured technologies from XAVIS, Leica Microsystems, and COXEM, and connect with our team to discuss solutions […]
2026 AReMS Annual Fall Meeting October 1–2, 2026 JH Technologies is excited to participate in the 2026 Appalachian Regional Microscopy Society (AReMS) Annual Fall Meeting, alongside our supplier CIQTEK. This year, JH Technologies will have its own booth, giving attendees the opportunity to meet directly with our team and explore the microscopy, imaging, and materials […]
ISTFA 2026 — International Symposium for Testing and Failure Analysis October 4–8, 2026Henry B. González Convention Center | San Antonio, Texas JH Technologies is excited to announce that our supplier, CIQTEK, will be participating in ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis. ISTFA brings together professionals from across the microelectronics failure […]
2026 Great Lakes Microscopy Society Annual Meeting October 9, 2026Michigan Technological University | Houghton, Michigan JH Technologies is pleased to announce that our supplier, CIQTEK, will be participating in the 2026 Great Lakes Microscopy Society (GLMS) Annual Meeting. The GLMS Annual Meeting brings together researchers, students, scientists, and microscopy professionals from across the Great Lakes […]
SEMICON West 2026 October 13–15 | Moscone Center | San Francisco, CA SEMICON West 2026 returns to San Francisco, CA, bringing together the world’s leading innovators, engineers, executives, and decision-makers across the microelectronics supply chain. Hosted at the iconic Moscone Center, this flagship event is the ultimate platform to explore the technologies, partnerships, and strategies […]
October 27–30, 2026JH Technologies | 213 Hammond Ave., Fremont, CA 94539 Join JH Technologies and Leica for a hands-on workshop focused on best practices for TEM, SEM, and AFM sample preparation using the Leica UC Enuity Ultramicrotome. This technical workshop will combine expert instruction, demonstrations, and hands-on sample preparation. Attendees will explore ultra-thin sectioning, block-face […]
From Imaging Instrument to Integrated Characterization Platform: Future Directions in SEM, FIB, and Correlative Microscopy Join us for an informative Lunch & Learn seminar featuring Luke Xin Ren, Application Director at CIQTEK America, as he explores the future of scanning electron microscopy (SEM), focused ion beam (FIB) technology, and correlative microscopy. This presentation will examine […]
Join JH Technologies and Bruker for an upcoming workshop focused on Electron Backscatter Diffraction (EBSD) and its applications in materials characterization. Learn more about how EBSD can be used to analyze crystallographic orientation, grain structure, phase distribution, and other microstructural features. This workshop will provide an opportunity to explore EBSD technology and gain insight into […]
AEMS 2026 — Anaheim Electronics & Manufacturing Show November 10–11, 2026Anaheim Convention Center | Anaheim, CAJH Technologies — Booth 513 Join JH Technologies at AEMS 2026, the Anaheim Electronics & Manufacturing Show, where we’ll showcase microscopy, imaging, metrology, and inspection solutions for today’s advanced manufacturing and technology applications. Visit us at Booth 513 to explore […]
Plan now to join us for free technical sessions, free lunch and the chance to network with leading suppliers to our industry! REGISTER HERE
