Sensofar S wide Surface Metrology
The S wide system uses Fringe Projection technology to quickly acquire large-area measurements with high vertical resolution. It includes analysis tools to extract data on roughness, flatness, critical dimensions, GD&T, and CAD comparisons.
Features
- Measuring with the S wide is as simple as it gets: load the sample, load the recipe, and check the results
- Large setups measure 300 x 300 mm stage configuration and up to 350 mm of height
- High data density of 3D scanner to capture every details
- Evaluate the flatness of your most extensive specimen
- Adaptable algorithms using optimized measurement protocols
Benefits
- Large viewing area and greater depth of focus minimizes repetitive motions calibration more efficient.
- The acquisition software provides a complete automatization of measurement procedures. It features tools for effortless programming of measurements at different positions
- Offers four distinct configurations that fit various scenarios, either a standard setup for R&D or an advanced solution for inline process control.
- Structured light system provides a large field of view (FOV) and depth of focus, enabling it to capture an impressive region of 35 x 29 x 40 mm.
What is the Fringe Projection System?
The S wide delivers quick measurements to minimize cycle time. It efficiently covers a large area without the need for Z movement. In addition, its customizable fringe projection modes further optimize measurement time for maximum efficiency.
Specifications
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