JH Technologies is proud to have sponsored LACCD Build-a-Hand challenge. This program offers STEM students the opportunity to build prosthetic hands that ultimately are donated to amputees through the LN4HANDPORJECT. In this competition teams of students get judged on Quality, efficiency, and teamwork.
In standard electron microscopy, non-conductive materials can be challenging to image accurately due to charge accumulation. However, low-vacuum scanning electron microscopy (SEM) offers a solution.
With Flexacam microscope cameras, you can see the fine sample details you need to see with precise colors and high resolution. Viewing, documenting, and sharing microscope images of your samples the way you want allows you to work flexibly.
We recently held a job shadow day at our Fremont office supporting Cañada College, located in Redwood City, CA. Two Cañada students spent the day shadowing our applications and mechinal engineers. They had an amazing experience!
In this webinar, we will introduce some basic techniques, considerations, and applications for ultramicrotomy workflows. We will cover both biological and materials ultramicrotomy and show some application examples for both areas.
Our SEM Buying Guide article provides advice on the most important topics to consider when evaluating SEM systems so that you can determine what factors are truly important for your workflow.
The EM-30 Series Tabletop Scanning Electron Microscopes are delivered with a standard motorized 3-axis stage for X/Y and Tilt. Working Distance or “Z” is very easy to set prior to closing the chamber and prevents accidental collisions by not having an external Z axis control.
With standard features like Auto-Leveling, Real-Time Vibration Monitoring and No Compressed Air Required – you will find the VAIS-AMT an invaluable accessory that will significantly enhance and improve any vibration sensitive instrumentation allowing you to gain the maximum capability for your microscope investment.
The Cold Stage enables examination of many biological samples that ordinarily contain significant moisture with complicated critical point drying or other fixation procedures.
Welcome Back to School everyone. With summer ending and students clamoring for knowledge we continue to support needy schools and institutions with equipment at no cost through our iFuSE program.
The EM-30 Plus series Desktop Scanning Electron Microscopes (SEM) are delivered with a 4 quadrant backscatter electron detector that can be operated in either COMPOSITION mode or TOPO mode.
The APEX™ software is an idealized program developed for first-time users with analysis functions for Point and Area Qualitative or Quantitative Elemental Analysis, Mapping, Line Scan, and built-in Reporting.
Adding Bruker EDS or EBSD to your tabletop SEM turns it into a powerful analytical tool allowing a multitude of capabilities using advanced microanalysis features for elemental analysis and crystalline characterization
Our new sales and marketing partnership with Ash Vision brings the world’s most advanced inspection technology solutions to JH Technologies' customers.
We are excited to announce our new partnership to market and support Sensofar's industry-leading metrology tool including advanced surface characterization systems.
New supplier relationships for us means exciting new and complementary products for you! Stay tuned for announcements as we unveil these new products that support micro metrology, inspections with AI technology, and NON-optical imaging.
Memory Device Cross-Sectioning: Learn as JH Analytical Lab manager Jerome Pons trains our new lab technician David Maita with this sample preparation process.
One challenge we face in the lab is preparing very soft, delicate, samples, such as polymer films, urethane and silicone, without damaging internal layers that can impact our ability to look at the material structure in our SEM.
In this month’s edition of Analytical Lab "Tips 'n Tricks," we show you the tools used to create “sandwiches” to protect delicate samples during processing.
Our supplier Buehler has been exceptional at keeping lead times to manageable levels. Our customers have been the benefactors with standard products available for quick delivery
EBSD requires a highly polished, flat surface to get best results. The two most common ways to polish as sample for EBSD are vibratory polishing and ion milling. Which is the best method?
The choice of a final polishing compound depends on the final desired result and the materials or material combination we are polishing. Learn more in this application note...
This article reviews how you can improve process speed and efficiency for SEM sample preparation before ion milling in the EM (electron microscopy) imaging workflow.
Lab Video: At JH Technologies, we run a full demonstration and analytical lab. You can come in at any time to use the equipment and gain an understanding of how it would work for you. We also provide services including sample preparation and imaging/analysis.
SERIES Part 1: In the first article of this series, you will experience the steps of a typical workflow used to analyze solder joint failure and characterize a suspect solder joint. Future articles will explore specific processes in greater detail.
Optic-Clean sanitizes each microscope eyepiece in about 60 seconds. It is also chemical-free and environmentally sound, helping users reduce their sterilizing materials costs.
JH Technologies announces the opening of JH Analytical Lab Services, providing complete outsourced process solutions to support customers with their medical device, semiconductor, metallography and other applications.
As an equipment supplier we are working to provide information and processes that help our customers manage instrument disinfection at their work sites.
In a classroom environment, microscopes are traditionally connected to a monitor or projector. this guide will enable you to connect your microscope to your computer and broadcast your screen over the internet.
This application note presents TESCAN's workflow for cryo electron tomography utilizing a Leica FIB (focused ion beam) SEM (scanning electron microscope).
Physical discomfort or pain is irritating and distractive. Physical comfort is the best precondition for consistent, efficient work. Whether in laboratories, manufacturing areas or quality control, ergonomic microscopes and accessories help users work in comfort even if they spend the entire day working with a microscope.
The Leica EZ4 educational stereomicroscope with 4.4:1 zoom is perfect for entry level university and college courses such as biology, anatomy and chemistry...
We recently held a job shadow day at our Fremont office supporting Cañada College, located in Redwood City, CA. Two Cañada students spent two days shadowing our applications and technical sales staff. They had an amazing experience!
Leica S9i Stereo Microscope Encoder enables accurate measurement throughout the full zoom range, enables reliable, accurate results and improves workflow...
