The MSC-SMC encourages networking and sharing of knowledge between scientists, corporations, students and retired members. PROMOTING MICROSCOPY SINCE 1972. Say Hi to our JH Team at the Ciqtek booth! REGISTER HERE!Â
Unlocking High-Resolution Imaging with the CIQTEK HEM6000 FE-SEM Date Monday, August 3, 2026 Time After Exhibit Hall Hours (5:45 PM - 6:45 PM) Location M&M - Booth #718 Overview Join JH Technologies and CIQTEK for an exclusive after-hours technical presentation showcasing the capabilities of the CIQTEK HEM6000 Field Emission Scanning Electron Microscope (FE-SEM). This presentation […]
M&M 2026 Baird Center | Milwaukee, WI I August 2-6, 2026 Join us at the Baird Center in Milwaukee, WI for M&M 2026. The world's leading annual forum for the science and technology of microscopy and microanalysis. REGISTER HERE
Join JH Technologies and CIQTEK After Hours at M&M 2026 đź“… Monday, August 3, 2026đź•” 5:45 PM – 6:45 PMđź“Ť Baird Center | Milwaukee, WIđź“Ś M&M 2026 | Booth 718 About the Event Join JH Technologies and CIQTEK after exhibit hall hours at the Microscopy & Microanalysis 2026 Conference for an evening technical presentation highlighting […]
Date Tuesday, August 4, 2026 Wednesday, August 5, 2026 Time 11:30 AM – 12:00 PM Location COXEM Booth M&M 2026 Exhibit Hall Overview Join JH Technologies for a complimentary Lunch & Learn featuring the COXEM EM-40 Tabletop Scanning Electron Microscope. This 30-minute presentation will explore how low vacuum imaging enables fast, efficient imaging of non-conductive […]
Be among the first to discover what’s next in optical metrology—and stay tuned as JH Technologies prepares to bring new surface profiling capabilities to our Analytical Lab later this year. Register here: https://www.sensofar.com/metrology/webinars/sensofar-event-26/ After the announcement, check back with JH Technologies for more information about our upcoming surface profiling system and how you may be […]
Join JH Technologies at IMTS 2026 in Chicago to explore advanced microscopy, metrology, and inspection solutions for precision manufacturing and quality control. Visit our partners at their booths to see the latest technologies and learn how advanced imaging, 3D optical profiling, and measurement solutions can support your manufacturing applications. Featured Exhibitors & Booths Leica Microsystems […]
Join JH Technologies at the NW Electronics Design & Manufacturing Expo (NEDME) in Portland for an exciting showcase of advanced microscopy, inspection, and analytical solutions for electronics and manufacturing applications. Visit JH Technologies at Booth 606 to explore our featured technologies from XAVIS, Leica Microsystems, and COXEM, and connect with our team to discuss solutions […]
2026 AReMS Annual Fall Meeting October 1–2, 2026 JH Technologies is excited to participate in the 2026 Appalachian Regional Microscopy Society (AReMS) Annual Fall Meeting, alongside our supplier CIQTEK. This year, JH Technologies will have its own booth, giving attendees the opportunity to meet directly with our team and explore the microscopy, imaging, and materials […]
ISTFA 2026 — International Symposium for Testing and Failure Analysis October 4–8, 2026Henry B. González Convention Center | San Antonio, Texas JH Technologies is excited to announce that our supplier, CIQTEK, will be participating in ISTFA 2026, the 52nd International Symposium for Testing and Failure Analysis. ISTFA brings together professionals from across the microelectronics failure […]
