Be among the first to discover what’s next in optical metrology—and stay tuned as JH Technologies prepares to bring new surface profiling capabilities to our Analytical Lab later this year. […]

Join JH Technologies at IMTS 2026 in Chicago to explore advanced microscopy, metrology, and inspection solutions for precision manufacturing and quality control. Visit our partners at their booths to see […]

Join JH Technologies at the NW Electronics Design & Manufacturing Expo (NEDME) in Portland for an exciting showcase of advanced microscopy, inspection, and analytical solutions for electronics and manufacturing applications. […]

2026 AReMS Annual Fall Meeting October 1–2, 2026 JH Technologies is excited to participate in the 2026 Appalachian Regional Microscopy Society (AReMS) Annual Fall Meeting, alongside our supplier CIQTEK. This […]

ISTFA 2026 — International Symposium for Testing and Failure Analysis October 4–8, 2026Henry B. González Convention Center | San Antonio, Texas JH Technologies is excited to announce that our supplier, […]

2026 Great Lakes Microscopy Society Annual Meeting October 9, 2026Michigan Technological University | Houghton, Michigan JH Technologies is pleased to announce that our supplier, CIQTEK, will be participating in the […]

October 27–30, 2026JH Technologies | 213 Hammond Ave., Fremont, CA 94539 Join JH Technologies and Leica for a hands-on workshop focused on best practices for TEM, SEM, and AFM sample […]

Join JH Technologies and Bruker for an upcoming workshop focused on Electron Backscatter Diffraction (EBSD) and its applications in materials characterization. Learn more about how EBSD can be used to […]