Webinar: Cone Beam CT vs. Oblique CT
đź“…Â Date: May 14 🎤 Speaker: Yifan Jiang 💬 Live Q&A: Yifan Jiang and Tim Schoen In this session, Yifan will walk through real-world examples of how X-ray CT helps reveal hidden issues such as solder voids, cracks, delamination, and internal structural defects in electronic devices. Attendees will gain practical insights into how CT imaging can improve failure diagnostics, quality control, and product […]