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2025 Equipment Tax Benefits to Consider

Reviving Legacy AFMs: How to Unlock New Capabilities

Automotive Paint Layer Characterization

Automotive Paint Layer Analysis with Microscopy & EDS | JH Technologies

What Is EBSD? A Guide to Electron Backscatter Diffraction in SEM

Ion Beam Milling System inside part - Leica TIC3x

What is Ion Milling?

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EBSD Analysis and SEM Platform Considerations

Multi-Technique Characterization of Solder Balls

Precision Solder ball Analysis Using Ion Beam Polishing and SEM

Tariff Policy Simplified: Stability, Transparency, and Trust

Demonstration Equipment: Beating The Tariff Trap

The Case of the Missing SEMs: A Story of Quick Thinking, Teamwork & Tech Recovery

JH Technologies Partners with Xavis to Deliver Advanced Inspection Solutions to North America

Ciqtek

New JH Technologies Partnership Focuses on Scanning Electron Microscopes

Buying Guide: Educational Microscopes for Students

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Lithium Battery Sample Preparation

What is the best method to prepare a sample for EBSD? [Application Note]

What is the best way to preserve and transport polished samples?

Handling Delicate Samples [Tips ‘n Tricks]

Sample Polishing Methods: Diamond Grinding Disks [APPLICATION NOTE]

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Polishing Soft Materials: What is the Best Way?

Memory Device Cross-Sectioning [Learn from the JHA Team]

How To Choose The Correct Mounting Method And Epoxy For Your Samples

What does a heat-treated metal look like after sample preparation and etching?

Application Note: Proper Maintenance and Cleaning of your Sputter Coater

Solutions for Semiconductor Applications

Bruker EDS & EBSD

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Coxem CP-8000

JH Technologies Partners With Evactron