EM Eunity Ultramicrotome
EM Eunity Ultramicrotome The next-generation ultramicrotome combines automated setup functions, advanced sectioning capabilities, and ergonomic design to enhance efficiency and quality in microscopy sample preparation. Features Benefits Specifications Video Downloads […]
EM TXP Sample Targeting Systems
Leica EM TXP Target Preparation for Electron Microscopy A versatile target preparation device for microscopy. Combining milling, sawing, grinding, and polishing capabilities with an integrated stereomicroscope, makes the EM TXP […]
Affordable EBSD (electron Backscatter Diffraction) for Material Analysis​
Affordable EBSD Systems for SEM-Based Material Analysis Upgrade your scanning electron microscope (SEM) with a reliable, compact EBSD systems for crystallographic and microstructural analysis. JH Technologies offers electron backscatter diffraction […]
Sputter Coating Systems
Coating Systems For Electron Microscopy Electron microscopy coating systems deposit thin, conductive layers (e.g., gold, platinum, carbon) onto samples, preventing charging artifacts and enhancing contrast in SEM and TEM imaging. […]
Buehler Vibratory Polisher
Buehler Vibratory Polisher The Buehler VibroMet 2 vibratory polisher, with a large, 12in [305mm] working surface for multiple samples, is designed to prepare high-quality polished surfaces for a wide variety […]