Focused Ion Beam SEM (FIB-SEM)

FIB-SEM (Focused Ion Beam SEM) | High Precision Nano-Analysis The CIQTEK DB550 is a high-performance Focused Ion Beam SEM (FIB) system that goes beyond traditional electron microscopy by integrating ion […]

Full Size Tungsten SEM

Full-Size Tungsten Filament SEM | High Performance Imaging The CIQTEK SEM3300 is a next-generation tungsten filament scanning electron microscope (SEM) designed for high-resolution imaging, precision surface analysis, and efficient material […]

Full Size Field Emission SEM

Full-Size Field Emission SEM (FE-SEM) | High-Resolution Imaging The CIQTEK SEM5000X is an high performance Field Emission Scanning Electron Microscope (FE-SEM) designed for nano-structural materials research and semiconductor development and […]

Sensofar S wide Surface Metrology

Sensofar S wide Surface Metrology The S wide system uses Fringe Projection technology to quickly acquire large-area measurements with high vertical resolution. It includes analysis tools to extract data on […]

Sensofar S neox Grand Format Product

Sensofar S neox Grand Format A high-performance, non-contact 3D optical profiler designed for advanced surface metrology applications of large panels in semiconductor, display, and PCB industries. The S neox Grand […]

Sensofar S neox

Sensofar S neox Automated Surface Profiling Sensofar 3D surface profiling solutions enable precise measurements and comprehensive analysis, essential for scientific research, industrial inspection, and quality control in fields such as […]

Sensofar S lynx 2

Sensofar S lynx 2 Automated Compact Surface Profiling Sensofar ‘s S lynx 2 compact 3D surface profiling system enables precise measurements and comprehensive analysis, in cost effective  small format platform. […]