Oxford SEM Detectors | EDS & EBSD Solutions
Oxford SEM Detectors | EDS & EBSD Solutions Oxford Instruments offers a complete portfolio of EDS (Energy Dispersive Spectroscopy) and EBSD (Electron Backscatter Diffraction) detectors designed to integrate seamlessly with […]
Bruker SEM Detectors | EDS & EBSD Solutions
Bruker SEM Detectors | EDS, EBSD, & Micro-XRF Solutions Bruker offers a comprehensive portfolio of EDS (Energy Dispersive Spectroscopy), EBSD (Electron Backscatter Diffraction), and micro-xrf (X-ray fluorescence) detectors, delivering high […]
Visoria M/P Materials Microscope
Advanced Materials & Polarization Microscopy | High-Performance Inspection The Visoria Series – Visoria M & Visoria P Microscopes deliver imaging and ergonomic operation for routine materials inspection, polarization microscopy, and […]
Focused Ion Beam SEM (FIB-SEM)
FIB-SEM (Focused Ion Beam SEM) | High Precision Nano-Analysis The CIQTEK DB550 is a high-performance Focused Ion Beam SEM (FIB) system that goes beyond traditional electron microscopy by integrating ion […]
Full Size Tungsten SEM
Full-Size Tungsten Filament SEM | High Performance Imaging The CIQTEK SEM3300 is a next-generation tungsten filament scanning electron microscope (SEM) designed for high-resolution imaging, precision surface analysis, and efficient material […]
Full Size Field Emission SEM
Full-Size Field Emission SEM (FE-SEM) | High-Resolution Imaging The CIQTEK SEM5000X is an high performance Field Emission Scanning Electron Microscope (FE-SEM) designed for nano-structural materials research and semiconductor development and […]
3D surface profiling OEM heads
3D surface profiling OEM heads Sensofar offers a range of high-precision optical measurement systems including the S onix sensor, S lynx 2, and S mart 2, which provide advanced technological […]
Leica DM Pol Microscopes
Polarizing Microscopes The Leica DM4 P, DM6 P, Visoria, and DM750 P are polarization microscopes designed for investigating crystalline structures in minerals, plastics, pharmaceuticals, and other materials with advanced optical […]
Hi-Flexibility Vision Measuring Systems
Hi-Flexibility Vision Measuring Systems Mitutoyo’s Quick Scope and Quick Image (manual and motorized) systems are advanced vision measuring devices offering high-precision measurements with user-friendly interfaces, suitable for various applications from […]
Sensofar S wide Surface Metrology
Sensofar S wide Surface Metrology The S wide system uses Fringe Projection technology to quickly acquire large-area measurements with high vertical resolution. It includes analysis tools to extract data on […]