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Microscopes
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EM TXP Sample Targeting Systems
Ergonomic Stereo Microscopes
Hardness Testing Vickers/Knoop & Brinell
Hardness Testing Rockwell, Universal
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Sputter Coating Systems
Leica M205 Research Grade Ergonomic Stereo Microscopes
Buehler Vibratory Polisher
Leica A60 Inspection & Assembly Microscope
Leica Ivesta Inspection & Assembly Microscope
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting​
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
High Resolution SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
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About Us
About JH
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iFUSE
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