FIB-SEM (Focused Ion Beam SEM) | High Precision Nano-Analysis

The CIQTEK DB550 is a high-performance Focused Ion Beam SEM (FIB) system that goes beyond traditional electron microscopy by integrating ion beam processing and nano-analysis capabilities

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DB550 FIB-SEM Microscope Key Features

The DB550 FIB-SEM delivers unparalleled resolution and precision with its integrated ion and electron beam technology, making it an essential tool for nanotechnology research and industrial applications.

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FIB-SEM DB550

DB550 Focused Ion Beam SEM Performance Advantages

FIB-SEM DB550

Delivering high-precision nano-fabrication and imaging, the DB550 FIB-SEM Microscope is an essential tool for semiconductor failure analysis, cross-sectioning, and advanced materials research.

  • Unmatched Nano-Scale Imaging & Fabrication – Combines high-resolution electron imaging with ion beam milling for precise material modification.
  • Cross-Sectioning & TEM Sample Preparation – Enables ultra-thin fabrication for Transmission Electron Microscopy (TEM)
  • High-Resolution Imaging Across Multiple Voltage Ranges  
  • Reduced Spatial Charging Effects – Super tunnel electron optics minimize charging, improving low-voltage imaging contrast.
  • Improved Lens Aberration Correction – Enhances clarity and resolution across different imaging modes.
  • All-in-One Nano-Analysis & Fabrication Workstation – Integrates gas injection, ion beam milling, and imaging for advanced research.
  • Advanced Semiconductor Failure Analysis – Supports defect inspection, circuit modification, and material etching.

Software Capabilities & Accessories

The DB550 FIB-SEM features a powerful software suite to streamline research and enhance nano-analysis capabilities.

  • User-Friendly GUI – Intuitive interface for controlling FIB-SEM functions.
  • Specimen Characterization Tools – Comprehensive analysis tools for material science and semiconductor research.
  • Cross-Section Analysis Software – Provides detailed structural visualization and precision sectioning controls.
  • Compatibility with Multiple Signal Detection Modes
  • Micro/Nano Fabrication Support – Includes customizable workflow automation for nano-manufacturing applications.
  • Software Development Kit (SDK) Available – Enable custom integration and automation for specialized research workflows.
  • Optional Image Post-Processing Tools – Enhances contrast, noise reduction, and feature extraction for high-precision imaging.
FIB-SEM DB550

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