Full Size Field Emission SEM
The CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FESEM) with optimized electron optics that reduce aberrations by 30%, enabling 0.6 nm resolution at 15 kV. It offers advanced imaging capabilities for nano-structural materials research and semiconductor IC chip development.
Full Size FESEM Features
- Breakthrough resolving power
- Mechanical eucentric specimen stage means the stage can be tilted or rotated while maintaining the same focal point
- Dual-beam deceleration mode
- Specimen exchange load-lock (8 inch compatible)
- High stability
- Unprecedented resolution down to 0.6 nm, enabling detailed nano-scale imaging
- Multiple imaging detectors (in-lens, ETD, BSED, STEM)
- Low-voltage, high-resolution imaging
- Optional software for automated measurements and image processing
Full Size FESEM Benefits
- Versatile imaging capabilities across multiple research and industrial domains
- Low-voltage imaging without specimen coating, preserving sample integrity
- Multiple detector options for comprehensive material characterization
- Ability to image diverse specimen types (polymers, ceramics, biological samples)
- Enhanced research capabilities in materials science, semiconductors, and nanotechnology
- Reduced sample preparation time with dual deceleration and low-voltage imaging
- Flexible imaging modes (bright-field, dark-field, Z-contrast)
- Expandable platform supporting various research and industrial applications
Software Capabilities
- Particle & Pore Analysis Software (Optional):
- Target detection and segmentation algorithms
- Image Post-processing Software:
- Integrated EM image processing functions
- Auto Measure Software (Optional):
- Multiple edge detection modes (Line, Space, Pitch)
- Software Development Kit (Optional):
- Complete microscope control interfaces
