Full-Size Field Emission SEM (FE-SEM) | High-Resolution Imaging

The CIQTEK SEM5000X is an high performance Field Emission Scanning Electron Microscope (FE-SEM) designed for nano-structural materials research and semiconductor development and engineered for stability, precision, and high-contrast imaging.

Looking for field emission scanning electron microscope prices? Request a custom quote today.

Key Features of the SEM5000X FE-SEM

Ultra-High Resolution Imaging

Achieves 0.6 nm resolution at 15kV for precise nano-scale imaging

Low-Voltage Imaging Without Coating

Preserves sample integrity while delivering high-contrast visualization.

Comprehensive Material Characterization

Equipped with multiple detectors (in-lens, ETD, BSED, STEM) for diverse imaging applications.

High Stability & Reduced Sample Prep Time

The dual-beam deceleration mode enhances low-voltage imaging, reducing drift and minimizing sample preparation time.

Breakthrough resolving power

Mechanical eucentric specimen stage

the stage can be tilted or rotated while maintaining the same focal point

Specimen exchange load-lock (8 inch compatible)

Looking for a field emission scanning electron microscope price? Request a custom quote today.

Performance Advantages of the SEM5000X FE-SEM

The SEM5000X FE-SEM offers superior imaging capabilities for materials science, semiconductor fabrication, and nanotechnology research:

Versatile Imaging Capabilities

Supports materials science, semiconductors, and nanotechnology

Low-voltage Imaging Without Coating

Reserves sample integrity while delivering high-contrast imaging

Comprehensive Material Characterization

Multiple detector options ensure detailed structural analysis

Supports a Wide Range of Samples

Compatible with polymers, ceramics, and biological specimens

Accelerated Research & Development

Reduces sample preparation time with dual deceleration and low-voltage imaging

Flexible Imaging Modes

Offers bright-field, dark-field, and Z-contrast imaging for enhanced visualization

Expandable Research Platform

Adaptable for emerging industrial and scientific applications

Interested in comparing Field Emission SEM pricing and configurations? Contact us today for a tailored quote.

Software and Automation Options for Enhanced Analysis

The SEM5000X offers optional software packages to streamline imaging, enhance data accuracy, and optimize research workflows:

Particle & Pore Analysis Software – Advanced target detection and segmentation
Integrated Image Processing – Post-processing tools for enhanced contrast and feature extraction
Auto Measure Software – Multiple edge detection modes (Line, Space, Pitch)
Software Development Kit – Complete microscope control for custom workflows

With intelligent automation and measurement tools, the SEM5000X accelerates data acquisition and analysis, improving productivity and reproducibility in research and industrial environments.