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Coxem Videos

COXEM CP 8000+ Operation Guide

Ion milling using CP-8000+ means a wider surface can be etched in a shorter time compared to FIB, with less physical damaged compared to machine grinding or sample fracturing methods.

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COXEM - What is a SEM?

Scanning Electron Microscope (SEM)
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CP-8000+ Introduction

An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam. 

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Coxem EM-30

A high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range. 

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