Microscope Vs SEM, Coxem EM 30 Comparison
Here we compare the capabilities of a Leica high powered microscope to a Coxem table-top scanning electron microscope
COXEM CP 8000+ Operation Guide
Ion milling using CP-8000+ means a wider surface can be etched in a shorter time compared to FIB, with less physical damaged compared to machine grinding or sample fracturing methods.
COXEM - What is a SEM?
Scanning Electron Microscope (SEM)
An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.
A high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range.